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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 26 — Sep. 10, 2009
  • pp: 4880–4884

Analysis of the imaging method for assessment of the smile of laser diode bars

Luis Martí-López, José A. Ramos-de-Campos, and Walter D. Furlan  »View Author Affiliations

Applied Optics, Vol. 48, Issue 26, pp. 4880-4884 (2009)

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We study imaging systems designed to assess the smile of laser diode bars (LDBs). The magnification matrix is derived from the required sampling period and the geometries of the LDBs and the charge-coupled device (CCD) array. These image-forming systems present in-plane pure translation invariance, but in the case of anamorphic ones, lack in-plane rotation invariance. It is shown that the smile parameters of the image of the LDB are linked with the smile parameters of the LDB by simple mathematical expressions. The spatial resolution of such optical systems is estimated at approximately 1 μm for a mean wavelength of λ 800 nm . Our results suggest that, with the current state-of-the-art, the formation of imaging methods for LDB smile assessment can be used to assess smile heights 1 μm .

© 2009 Optical Society of America

OCIS Codes
(110.2960) Imaging systems : Image analysis
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(140.2010) Lasers and laser optics : Diode laser arrays

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: September 30, 2008
Revised Manuscript: July 21, 2009
Manuscript Accepted: August 10, 2009
Published: September 1, 2009

Luis Martí-López, José A. Ramos-de-Campos, and Walter D. Furlan, "Analysis of the imaging method for assessment of the smile of laser diode bars," Appl. Opt. 48, 4880-4884 (2009)

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  1. G. A. Agrawal and N. K. Dutta, Semiconductor Lasers, 2nd ed. (Van Nostrand Reinhold, 1993).
  2. R. Diehl, High-Power Diode Lasers: Fundamentals, Technology, Applications (Springer-Verlag, 2000). [CrossRef]
  3. H.-G. Treusch, A. Ovtchinnikov, X. He, M. Kanskar, J. Mott, and S. Yang, “High-brightness semiconductor laser sources for materials processing: stacking, beam shaping, and bars,” IEEE J. Sel. Top. Quantum Electron. 6, 601-614(2000). [CrossRef]
  4. W. Schulz and R. Poprawe, “Manufacturing with novel high-power diode lasers,” IEEE J. Sel. Top. Quantum Electron. 6, 696-705 (2000). [CrossRef]
  5. N. U. Wetter, “Three-fold effective brightness increase of laser diode bar emission by assessment and correction of diode array curvature,” Opt. Laser Technol. 33, 181-187(2001). [CrossRef]
  6. C. L. Talbot, M. E. J. Friese, D. Wang, I. Brereton, N. R. Heckenberg, and H. Rubinsztein-Dunlop, “Linewidth reduction in a large-smile laser diode array,” Appl. Opt. 44, 6264-6268(2005). [CrossRef] [PubMed]
  7. J. F. Monjardin, K. M. Nowak, H. J. Baker, and D. R. Hall, “Correction of beam errors in high power laser diode bars and stacks,” Opt. Express 14, 8178-8183 (2006). [CrossRef] [PubMed]
  8. U. Dürig, D. W. Pohl, and F. Rohner, “Near field optical-scanning microscopy,” J. Appl. Phys. 59, 3318-3327 (1986). [CrossRef]
  9. E. Betzig and J. K. Trautman, “Near-field optics: microscopy, spectroscopy, and surface modification beyond the diffraction limit,” Science 257, 189-195 (1992). [CrossRef] [PubMed]
  10. W. D. Herzog, M. S. Ünlü, B. B. Goldberg, G. H. Rodees, and C. Harder, “Beam divergence and waist measurements of laser diodes by near-field scanning optical microscopy,” Appl. Phys. Lett. 70, 688-690 (1997). [CrossRef]
  11. C. Scholz and M. Belitz, “High resolution near-field analysis of high-power diode lasers,” http://www.ilt.fraunhofer.de/eng/100299.html.
  12. L. Martí-López, J. A. Ramos-de-Campos, and R. A. Martínez-Celorio, “Interferometric method for characterizing the smile of laser diode bars,” Opt. Commun. 275, 359-371 (2007). [CrossRef]
  13. M. S. Nixon and A. S. Aguado, Feature Extraction and Image Processing (Newnes, 2002).
  14. J. W. Goodman, Introduction to Fourier Optics, 2nd ed. (McGraw-Hill, 1996).
  15. J. L. Hunt, B. G. Nickel, and C. Gigault, “Anamorphic images,” Am. J. Phys. 68, 232-237 (2000). [CrossRef]
  16. S. Inoué and R. Oldenbourg, “Microscopes,” in Handbook of Optics: Devices, Measurements and Properties,M. Bass, E. W. Van Stryland, D. Williams, and W. L. Wolfe, eds. (McGraw-Hill, 1995), Vol. 2.

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