Angle resolved Mueller polarimetry with a high numerical aperture and characterization of transparent biaxial samples
Applied Optics, Vol. 48, Issue 27, pp. 5025-5034 (2009)
http://dx.doi.org/10.1364/AO.48.005025
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Abstract
We present a polarimetric instrument suitable for the simultaneous measurement of angle resolved normalized Mueller matrices for polar angles ranging from
© 2009 Optical Society of America
OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: March 16, 2009
Revised Manuscript: July 14, 2009
Manuscript Accepted: August 13, 2009
Published: September 10, 2009
Citation
Bicher Haj Ibrahim, Sami Ben Hatit, and Antonello De Martino, "Angle resolved Mueller polarimetry with a high numerical aperture and characterization of transparent biaxial samples," Appl. Opt. 48, 5025-5034 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-27-5025
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