OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 27 — Sep. 20, 2009
  • pp: 5025–5034

Angle resolved Mueller polarimetry with a high numerical aperture and characterization of transparent biaxial samples

Bicher Haj Ibrahim, Sami Ben Hatit, and Antonello De Martino  »View Author Affiliations


Applied Optics, Vol. 48, Issue 27, pp. 5025-5034 (2009)
http://dx.doi.org/10.1364/AO.48.005025


View Full Text Article

Enhanced HTML    Acrobat PDF (1689 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We present a polarimetric instrument suitable for the simultaneous measurement of angle resolved normalized Mueller matrices for polar angles ranging from 0 ° to 60 ° and all azimuths. The polarimetric modulation and analysis are performed by means of an optimized polarization state generator and analyzer based on nematic liquid crystals. A high numerical aperture (0.95) microscope objective is used in double pass to illuminate the sample, with its rear focal plane imaged on a low noise CCD. This polarimeter can be used either in reflection, with the sample set in the objective front focal plane, or in transmission, for thin transparent samples. This latter configuration, which involves an additional spherical mirror with its center of curvature at the objective front focus, is described in detail. This instrument was used to accurately determine the directions of the optic axes and the angular dependence of the retardation of a biaxial polyethylene terephthalate (PET) plastic substrate in spite of the strong depolarization essentially due to the source 10 nm spectral width or the limitation in angular resolution due to the pixels distribution of the CCD combined with the sample large retardation.

© 2009 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 16, 2009
Revised Manuscript: July 14, 2009
Manuscript Accepted: August 13, 2009
Published: September 10, 2009

Citation
Bicher Haj Ibrahim, Sami Ben Hatit, and Antonello De Martino, "Angle resolved Mueller polarimetry with a high numerical aperture and characterization of transparent biaxial samples," Appl. Opt. 48, 5025-5034 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-27-5025

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited