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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 27 — Sep. 20, 2009
  • pp: 5099–5104

Tri-arm multipinhole interferometer for wavefront measurement and diffractive imaging

Gong-Xiang Wei, Lei-Lei Lu, Cheng-Shan Guo, and Hui-Tian Wang  »View Author Affiliations

Applied Optics, Vol. 48, Issue 27, pp. 5099-5104 (2009)

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We propose a tri-arm (or Y-shaped) multipinhole (MP) interferometer for wavefront measurement based on a specially designed tri-arm MP plate. We demonstrate that the complex amplitude of a wavefront sampled by the tri-arm MP plate inserted between the object and the detector plane can be extracted directly from the Fourier transform of a far-field diffraction intensity pattern without the need for any iterative algorithm. A form of coherent diffractive imaging based on a rotatable tri-arm MP plate is also demonstrated, which provides a feasible approach for lensless diffractive imaging in real time

© 2009 Optical Society of America

OCIS Codes
(100.0100) Image processing : Image processing
(100.3010) Image processing : Image reconstruction techniques
(100.5070) Image processing : Phase retrieval
(110.0110) Imaging systems : Imaging systems
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Image Processing

Original Manuscript: June 15, 2009
Revised Manuscript: August 24, 2009
Manuscript Accepted: August 24, 2009
Published: September 10, 2009

Gong-Xiang Wei, Lei-Lei Lu, Cheng-Shan Guo, and Hui-Tian Wang, "Tri-arm multipinhole interferometer for wavefront measurement and diffractive imaging," Appl. Opt. 48, 5099-5104 (2009)

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