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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 27 — Sep. 20, 2009
  • pp: 5155–5163

Using quantum dots to tag subsurface damage in lapped and polished glass samples

Wesley B. Williams, Brigid A. Mullany, Wesley C. Parker, Patrick J. Moyer, and Mark H. Randles  »View Author Affiliations

Applied Optics, Vol. 48, Issue 27, pp. 5155-5163 (2009)

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Grinding, lapping, and polishing are finishing processes used to achieve critical surface parameters in a variety of precision optical and electronic components. As these processes remove material from the surface through mechanical and chemical interactions, they may induce a damaged layer of cracks, voids, and stressed material below the surface. This subsurface damage (SSD) can degrade the performance of a final product by creating optical aberrations due to diffraction, premature failure in oscillating components, and a reduction in the laser induced damage threshold of high energy optics. As these defects lie beneath the surface, they are difficult to detect, and while many methods are available to detect SSD, they can have notable limitations regarding sample size and type, preparation time, or can be destructive in nature. The authors tested a nondestructive method for assessing SSD that consisted of tagging the abrasive slurries used in lapping and polishing with quantum dots (nano-sized fluorescent particles). Subsequent detection of fluorescence on the processed surface is hypothesized to indicate SSD. Quantum dots that were introduced to glass surfaces during the lapping process were retained through subsequent polishing and cleaning processes. The quantum dots were successfully imaged by both wide field and confocal fluorescence microscopy techniques. The detected fluorescence highlighted features that were not observable with optical or interferometric microscopy. Atomic force microscopy and additional confocal microscope analysis indicate that the dots are firmly embedded in the surface but do not appear to travel deep into fractures beneath the surface. Etching of the samples exhibiting fluorescence confirmed that SSD existed. SSD-free samples exposed to quantum dots did not retain the dots in their surfaces, even when polished in the presence of quantum dots.

© 2009 Optical Society of America

OCIS Codes
(160.2750) Materials : Glass and other amorphous materials
(220.5450) Optical design and fabrication : Polishing

ToC Category:
Optical Design and Fabrication

Original Manuscript: July 1, 2009
Manuscript Accepted: August 13, 2009
Published: September 11, 2009

Wesley B. Williams, Brigid A. Mullany, Wesley C. Parker, Patrick J. Moyer, and Mark H. Randles, "Using quantum dots to tag subsurface damage in lapped and polished glass samples," Appl. Opt. 48, 5155-5163 (2009)

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  1. P. P. Hed, D. F. Edwards, and J. B. Davis, “Subsurface damage in optical materials: origin, measurement and removal,” paper presented at the ASPE Spring Conference on Sub-Surface Damage in Glass, Tucson, Arizona, 25-27 April 1989.
  2. D. W. Camp, M. R. Kozlowski, L. M. Sheehan, M. A. Nichols, M. Dovik, R. Raether, and I. Thomas, “Subsurface damage and polish compound affects the 355 nm laser damage threshold of fused silica surfaces,” Proc. SPIE 3244, 356-364 (1998). [CrossRef]
  3. J. C. Lambropoulos, Y. Li, P. Fukenbusch, and J. Ruckman, “Non-contact estimate of grinding-induced subsurface damage,” Proc. SPIE 3782, 41-50 (1999). [CrossRef]
  4. B. R. Lawn and T. R. Wilshaw, “Review indentation fracture: principles and applications,” J. Mater. Sci. Technol. (Sofia) 10, 1049-1081 (1975).
  5. L. M. Cook, “Chemical processes in glass polishing,” J. Non-Cryst. Solids 120, 152-171 (1990). [CrossRef]
  6. F. P. Bowden and T. P. Hughes, “Physical properties of surfaces. IV. Polishing, surface flow and the formation of the Beilby layer,” Proc. R. Soc. London Ser. A 160, 575-587(1937). [CrossRef]
  7. N. K. Adam, “The polishing of surfaces,” Nature 119, 162-163(1927). [CrossRef]
  8. A. A. Griffith, “The phenomona of rupture and flow in solids,” Phil. Trans. R. Soc. London Ser. A 221, 163-198 (1921). [CrossRef]
  9. J. Shen, S. Liu, K. YI, H. He, J. Shao, and Z. Fan, “Subsurface damage in optical substrates,” Optik (Jena) 116, 288-294(2005). [CrossRef]
  10. D. A. Lucca, E. Brinksmeier, and G. Goch, “Progress in assessing surface and subsurface integrity,” CIRP Ann. Manuf. Technol. 47, 669-693 (1998). [CrossRef]
  11. E. Brinksmeier, “State of the art of nondestructive measurement of subsurface material properties and damages,” Precis. Eng. 11, 211-224 (1989). [CrossRef]
  12. A. Lindquist, S. D. Jacobs, and A. Feltz, “Surface preparations for rapid measurement of subsurface damage depth,” presented at the OSA Science of Optical Finishing Topical Meeting, Monterey, California (1990).
  13. “Quantum dots features,” (Evident Technologies, 2008), http://www.evidenttech.com/quantum-dots-explained/quantum-dot-features.html, retrieved 14 April 2008.
  14. B. O. Dabbousi, M. G. Bawendi, O. Onitsuka, and M. F. Rubner, “Electroluminescence from CdSe quantum-dot/polymer composites,” Appl. Phys. Lett. 66, 1316-1318 (1995). [CrossRef]
  15. B. O. Dabbousi, O. Onitsuka, M. F. Rubner, and M. G. Bawendi, “Size dependent electroluminescence from CdSe nanocrystallites (quantum dots),” Mater. Res. Soc. Symp. Proc. 358, 707-712 (1995). [CrossRef]
  16. “Nanomaterials catalog,” (Evident Technologies, 2005), Vol. 7.
  17. R. A. Bowling, “A theoretical review of particle adhesion," in Particle on Surface. I. Detection, Adhesion, and Removal, K. L. Mittal, ed. (Plenum, 1988), pp. 129-142.
  18. M. Wautelet, “Scaling laws in the macro-, micro- and nanoworlds,” Eur. J. Phys. 22, 601-611 (2001). [CrossRef]
  19. B. V. Derjaguin, V. M. Muller, and Y. P. Toporov, “Effect of contact deformations on the adhesion of particles,” J. Colloid Interface Sci. 53, 314 (1975). [CrossRef]
  20. D. Tabor, “Surface forces and surface interactions,” J. Colloidal Interface Sci. 58, 2-13 (1977). [CrossRef]
  21. G. M. Burdick, N. S. Berman, and S. P. Beaudoin, “Describing hydrodynamic particle removal from surfaces using the particle Reynolds number,” J. Nanopart. Res. 3, 453-465 (2001). [CrossRef]
  22. K. L. Johnson, K. Kendall, and A. D. Roberts, “Surface energy and the contact of elastic solids,” Proc. R. Soc. London Ser. A 324, 301-311 (1971). [CrossRef]
  23. Y.-P. Zhao, X. Shi, and W. J. Li, “Effect of work of adhesion on nanoindentation,” Rev. Adv. Mater. Sci. 5, 348-353 (2003).
  24. J. Visser, “Particle adhesion and removal: a review,” Part. Sci. Technol. 13, 169-196 (1995). [CrossRef]
  25. F. Zhang and A. A. Busnaina, “Submicron particle removal in post-oxide chemical-mechanical planarization (CMP) cleaning,” Appl. Phys. A 69, 437-440 (1999). [CrossRef]
  26. A. A. Busnaina, H. Lin, N. Moumen, J.-W. Feng, and J. Taylor, “Particle adhesion and removal mechanisms in post-CMP cleaning processes,” IEEE Trans. Semicond. Manuf. 15, 374-382 (2002). [CrossRef]
  27. E. L. Cusser, Diffusion: Mass Transfer in Fluid Systems (Cambridge University, 1984).
  28. K. Elliott, “Development of a versatile scanning system for multiprobe biomedical measurements,” Ph.D. dissertation (University of North Carolina at Charlotte, 2008).
  29. M. Minsky, “Microscopy apparatus,” U.S. patent 3013467(19 December 1961).
  30. D. Semwogerere and E. R. Weeks, “Confocal microscopy,” in Encyclopedia of Biomaterials and Biomedical Engineering (Taylor & Francis, 2005), pp. 1-10.
  31. “Soda lime glass 0215 Corning glass slides,” (Ted Pella Inc.), www.tedpella.com/technote_html/0215%corning%20glass.pdf.
  32. M. Hines, Evident Technologies, Troy, New York (personal communication, 2008).
  33. L. Bergstrom, “Hamaker constants of inorganic materials,” Adv. Colloid Interface Sci. 70, 125-169 (1997). [CrossRef]
  34. Z. Wang, L. L. Daemen, Y. Zhao, C. S. Zha, R. T. Down, X. Wang, Z. L. Wang, and R. J. Hemley, “Morphology-tuned wurtzite-type ZnS nanobelts,” Nat. Mater. 4, 922-927 (2005). [CrossRef] [PubMed]
  35. “Zinc sulfide specifications,” (ISP Optics), www.ispoptics.com/OpticalMaterialsSpecs.htm.

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