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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 27 — Sep. 20, 2009
  • pp: 5197–5204

Characterizing large-area electro-optic crystals toward two-dimensional real-time terahertz imaging

Fanzhen Meng, Mark D. Thomson, Volker Blank, Wolff von Spiegel, Torsten Löffler, and Hartmut G. Roskos  »View Author Affiliations

Applied Optics, Vol. 48, Issue 27, pp. 5197-5204 (2009)

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We have characterized the homogeneity of large-area ( > 10 m m × 10 m m ) Cd Te ( 110 ) and Zn Te ( 110 ) crystals using a raster electro-optic scanning method to assess their usability in two-dimensional electro- optic terahertz (THz) imaging with parallel read out. The spatial variation in the detected THz signal (at 0.2 and 0.645 THz , respectively) is due to nonuniform residual birefringence and scattering. For CdTe, this depends critically on the growth method, and has an important contribution from slip planes in the crystals, as is evident in the scanned images. For the highest-quality Cd Te ( 110 ) crystals investigated, the rms signal variations are less than 15%, comparable to those for Zn Te ( 110 ) . For electro-optic scanning, we introduce a hybrid measurement system based on a fs Nd:glass laser and a continuous-wave elec tronic THz source.

© 2009 Optical Society of America

OCIS Codes
(160.2100) Materials : Electro-optical materials
(300.6495) Spectroscopy : Spectroscopy, teraherz
(110.6795) Imaging systems : Terahertz imaging

ToC Category:
Imaging Systems

Original Manuscript: June 5, 2009
Manuscript Accepted: August 13, 2009
Published: September 15, 2009

Fanzhen Meng, Mark D. Thomson, Volker Blank, Wolff von Spiegel, Torsten Löffler, and Hartmut G. Roskos, "Characterizing large-area electro-optic crystals toward two-dimensional real-time terahertz imaging," Appl. Opt. 48, 5197-5204 (2009)

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