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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 28 — Oct. 1, 2009
  • pp: 5307–5317

Determination of the components of the gyration tensor of quartz by oblique incidence transmission two-modulator generalized ellipsometry

Oriol Arteaga, Adolf Canillas, and Gerald E. Jellison, Jr.  »View Author Affiliations

Applied Optics, Vol. 48, Issue 28, pp. 5307-5317 (2009)

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The two independent components of the gyration tensor of quartz, g 11 and g 33 , have been spectroscopically measured using a transmission two-modulator generalized ellipsometer. The method is used to determine the optical activity in crystals in directions other than the optic axis, where the linear birefringence is much larger than the optical activity.

© 2009 Optical Society of America

OCIS Codes
(260.1180) Physical optics : Crystal optics
(260.1440) Physical optics : Birefringence
(160.1585) Materials : Chiral media
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Physical Optics

Original Manuscript: July 31, 2009
Manuscript Accepted: August 14, 2009
Published: September 21, 2009

Oriol Arteaga, Adolf Canillas, and Gerald E. Jellison, Jr., "Determination of the components of the gyration tensor of quartz by oblique incidence transmission two-modulator generalized ellipsometry," Appl. Opt. 48, 5307-5317 (2009)

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