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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 28 — Oct. 1, 2009
  • pp: 5380–5385

Temperature field analysis of single-layer Ti O 2 films

Shu-hong Li, Hong-bo He, Xiu-lan Ling, Chun-xian Tao, Yuan-an Zhao, and Zheng-xiu Fan  »View Author Affiliations

Applied Optics, Vol. 48, Issue 28, pp. 5380-5385 (2009)

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A method is presented to evaluate optical absorption at a random wavelength by calculating temperature distribution in single-layer Ti O 2 films. Temperature distribution in single-layer Ti O 2 films was analyzed based on temperature field theory. Through our calculations, optical absorption variation was obtained to be similar to that of surface temperature rise in films. The surface temperature rise depends on film thickness, refractive index, extinction coefficient, specific heat, and thermal conductivity. Furthermore, the optical absorptions of the same single-layer Ti O 2 film at different wavelengths were deduced. As an example, the surface temperature rises were calculated for the 19 single-layer Ti O 2 films, which had been prepared by 12 different laboratories for the annual meeting of the Optical Society of America in 1986. The results agree well with the measured optical absorptions.

© 2009 Optical Society of America

OCIS Codes
(240.0310) Optics at surfaces : Thin films
(310.4925) Thin films : Other properties (stress, chemical, etc.)

ToC Category:
Thin Films

Original Manuscript: May 26, 2009
Revised Manuscript: August 26, 2009
Manuscript Accepted: September 3, 2009
Published: September 22, 2009

Shu-hong Li, Hong-bo He, Xiu-lan Ling, Chun-xian Tao, Yuan-an Zhao, and Zheng-xiu Fan, "Temperature field analysis of single-layer TiO2 films," Appl. Opt. 48, 5380-5385 (2009)

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