Simultaneous identification of the low-field-induced tiny variation of complex refractive index for anisotropic and opaque magnetic-fluid thin film by a stable heterodyne Mach-Zehnder interferometer
Applied Optics, Vol. 48, Issue 29, pp. 5604-5611 (2009)
http://dx.doi.org/10.1364/AO.48.005604
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Abstract
We use a heterodyne Mach–Zehnder interferometer to simultaneously and simply measure the complex refractive index by only normal incidence on the specimen, instead of using a complicated measurement procedure or instrument that only measures the real or imaginary part of the complex refractive index. To study the tiny variation of the complex refractive index, the small complex refractive-index variation of a rare-concentration magnetic-fluid thin film, due to a weak field of less than
© 2009 Optical Society of America
OCIS Codes
(260.1440) Physical optics : Birefringence
(260.2110) Physical optics : Electromagnetic optics
(310.6860) Thin films : Thin films, optical properties
ToC Category:
Interferometry
History
Original Manuscript: March 26, 2009
Revised Manuscript: September 1, 2009
Manuscript Accepted: September 9, 2009
Published: October 7, 2009
Citation
Chin-Yih Hong, Jen-Jie Chieh, Shieh-Yueh Yang, Hong-Chang Yang, and Herng-Er Horng, "Simultaneous identification of the low-field-induced tiny variation of complex refractive index for anisotropic and opaque magnetic-fluid thin film by a stable heterodyne Mach-Zehnder interferometer," Appl. Opt. 48, 5604-5611 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-29-5604
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