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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 29 — Oct. 10, 2009
  • pp: 5604–5611

Simultaneous identification of the low-field-induced tiny variation of complex refractive index for anisotropic and opaque magnetic-fluid thin film by a stable heterodyne Mach–Zehnder interferometer

Chin-Yih Hong, Jen-Jie Chieh, Shieh-Yueh Yang, Hong-Chang Yang, and Herng-Er Horng  »View Author Affiliations


Applied Optics, Vol. 48, Issue 29, pp. 5604-5611 (2009)
http://dx.doi.org/10.1364/AO.48.005604


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Abstract

We use a heterodyne Mach–Zehnder interferometer to simultaneously and simply measure the complex refractive index by only normal incidence on the specimen, instead of using a complicated measurement procedure or instrument that only measures the real or imaginary part of the complex refractive index. To study the tiny variation of the complex refractive index, the small complex refractive-index variation of a rare-concentration magnetic-fluid thin film, due to a weak field of less than 200 Oe , was processed by this interferometer. We also present the wavelength trend of the complex refractive index of magnetic fluids to verify the appearance of the slight change in a small wavelength range.

© 2009 Optical Society of America

OCIS Codes
(260.1440) Physical optics : Birefringence
(260.2110) Physical optics : Electromagnetic optics
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Interferometry

History
Original Manuscript: March 26, 2009
Revised Manuscript: September 1, 2009
Manuscript Accepted: September 9, 2009
Published: October 7, 2009

Citation
Chin-Yih Hong, Jen-Jie Chieh, Shieh-Yueh Yang, Hong-Chang Yang, and Herng-Er Horng, "Simultaneous identification of the low-field-induced tiny variation of complex refractive index for anisotropic and opaque magnetic-fluid thin film by a stable heterodyne Mach-Zehnder interferometer," Appl. Opt. 48, 5604-5611 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-29-5604

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