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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 31 — Nov. 1, 2009
  • pp: 5948–5955

Anomalous dispersion in atomic line filters applied for spatial frequency detection

Andrin Landolt and Thomas Roesgen  »View Author Affiliations


Applied Optics, Vol. 48, Issue 31, pp. 5948-5955 (2009)
http://dx.doi.org/10.1364/AO.48.005948


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Abstract

The anomalous dispersion of an atomic line filter near a resonant transition is exploited for full-field frequency measurements. The influence of the line shape function on the dispersion in atomic vapors near resonance and the possibilities to increase sensitivity are discussed. From the model-calculated absorption of iodine vapor at frequency-doubled Nd:YAG laser wavelengths, the corresponding refractive index is obtained through the Kramers–Kronig relations. Both variables are used to assess the performance of a iodine vapor cell as a dispersive element in an interferometric setup for Doppler frequency shift detection. With good agreement, the predicted sensitivity of the setup is compared to an experimental calibration. Observed discrepancies are attributed to the assumption of a Gaussian line shape in the absorption model. The full-field Doppler frequency measurement capacity of the technique is demonstrated in a rotating disk experiment, and the measurement performance is assessed.

© 2009 Optical Society of America

OCIS Codes
(120.7250) Instrumentation, measurement, and metrology : Velocimetry
(160.4670) Materials : Optical materials
(260.2030) Physical optics : Dispersion
(280.2490) Remote sensing and sensors : Flow diagnostics
(110.3175) Imaging systems : Interferometric imaging

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 29, 2009
Manuscript Accepted: September 22, 2009
Published: October 23, 2009

Citation
Andrin Landolt and Thomas Roesgen, "Anomalous dispersion in atomic line filters applied for spatial frequency detection," Appl. Opt. 48, 5948-5955 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-31-5948


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