Abstract

We overview the benefits that extended depth of focus technology may provide for three-dimensional imaging and profilometry. The approaches for which the extended depth of focus benefits are being examined include stereoscopy, light coherence, pattern projection, scanning line, speckles projection, and projection of axially varied shapes.

© 2009 Optical Society of America

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History
Original Manuscript: July 22, 2009
Manuscript Accepted: September 18, 2009
Revised Manuscript: September 16, 2009
Published: October 9, 2009

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Author Affiliations

Alex Zlotnik, Shai Ben-Yaish, Zeev Zalevsky

Bar-Ilan University

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