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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 34 — Dec. 1, 2009
  • pp: H105–H112

Extending the depth of focus for enhanced three-dimensional imaging and profilometry: an overview

Alex Zlotnik, Shai Ben-Yaish, and Zeev Zalevsky  »View Author Affiliations


Applied Optics, Vol. 48, Issue 34, pp. H105-H112 (2009)
http://dx.doi.org/10.1364/AO.48.00H105


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Abstract

We overview the benefits that extended depth of focus technology may provide for three-dimensional imaging and profilometry. The approaches for which the extended depth of focus benefits are being examined include stereoscopy, light coherence, pattern projection, scanning line, speckles projection, and projection of axially varied shapes.

© 2009 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(110.2945) Imaging systems : Illumination design

History
Original Manuscript: July 22, 2009
Revised Manuscript: September 16, 2009
Manuscript Accepted: September 18, 2009
Published: October 9, 2009

Virtual Issues
(2009) Advances in Optics and Photonics
Digital Holography and 3-D Imaging: Interactive Science Publishing (2009) Applied Optics

Citation
Alex Zlotnik, Shai Ben-Yaish, and Zeev Zalevsky, "Extending the depth of focus for enhanced three-dimensional imaging and profilometry: an overview," Appl. Opt. 48, H105-H112 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-34-H105


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