Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B4C multilayer
Applied Optics, Vol. 48, Issue 35, pp. 6684-6691 (2009)
http://dx.doi.org/10.1364/AO.48.006684
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Abstract
Soft-x-ray Bragg reflection from two
© 2009 Optical Society of America
OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(310.6860) Thin films : Thin films, optical properties
(340.7470) X-ray optics : X-ray mirrors
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: September 3, 2009
Revised Manuscript: October 14, 2009
Manuscript Accepted: November 5, 2009
Published: December 1, 2009
Citation
Dmitriy Ksenzov, Tobias Panzner, Christoph Schlemper, Christian Morawe, and Ullrich Pietsch, "Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B4C multilayer," Appl. Opt. 48, 6684-6691 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-35-6684
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