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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 35 — Dec. 10, 2009
  • pp: 6684–6691

Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru / B 4 C multilayer

Dmitriy Ksenzov, Tobias Panzner, Christoph Schlemper, Christian Morawe, and Ullrich Pietsch  »View Author Affiliations

Applied Optics, Vol. 48, Issue 35, pp. 6684-6691 (2009)

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Soft-x-ray Bragg reflection from two Ru / B 4 C multilayers with 10 and 63 periods was used for inde pendent determination of both real and imaginary parts of the refractive index n = 1 δ + i β close to the boron K edge ( 188 eV ). Prior to soft x-ray measurements, the structural parameters of the multilayers were determined by x-ray reflectometry using hard x rays. For the 63-period sample, the optical properties based on the predictions made for elemental boron major deviations were found close to the K edge of boron for the 10-period sample explained by chemical bonding of boron to B 4 C and various boron oxides.

© 2009 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(310.6860) Thin films : Thin films, optical properties
(340.7470) X-ray optics : X-ray mirrors

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: September 3, 2009
Revised Manuscript: October 14, 2009
Manuscript Accepted: November 5, 2009
Published: December 1, 2009

Dmitriy Ksenzov, Tobias Panzner, Christoph Schlemper, Christian Morawe, and Ullrich Pietsch, "Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B4C multilayer," Appl. Opt. 48, 6684-6691 (2009)

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