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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 5 — Feb. 10, 2009
  • pp: 886–892

X-ray shearing interferometer and generalized grating imaging

Koichi Iwata  »View Author Affiliations

Applied Optics, Vol. 48, Issue 5, pp. 886-892 (2009)

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X-ray shearing interferometers with three gratings are analyzed on the basis of generalized grating imaging theory. The result of this analysis is applied to an already proposed interferometer. The contrast of the imaging fringes in the interferometer is calculated quantitatively. It is also applied to explain the spatial resolution of the image.

© 2009 Optical Society of America

OCIS Codes
(050.1960) Diffraction and gratings : Diffraction theory
(050.2770) Diffraction and gratings : Gratings
(110.6760) Imaging systems : Talbot and self-imaging effects
(340.7440) X-ray optics : X-ray imaging
(340.7450) X-ray optics : X-ray interferometry

ToC Category:
Diffraction and Gratings

Original Manuscript: October 2, 2008
Revised Manuscript: December 20, 2008
Manuscript Accepted: December 23, 2008
Published: February 12, 2009

Koichi Iwata, "X-ray shearing interferometer and generalized grating imaging," Appl. Opt. 48, 886-892 (2009)

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