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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 6 — Feb. 20, 2009
  • pp: 1135–1142

Systematic errors specific to a snapshot Mueller matrix polarimeter

Matthieu Dubreuil, Sylvain Rivet, Bernard Le Jeune, and Jack Cariou  »View Author Affiliations

Applied Optics, Vol. 48, Issue 6, pp. 1135-1142 (2009)

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Systematic errors specific to a snapshot Mueller matrix polarimeter are studied. Their origins and effects are highlighted, and solutions for correction and stabilization are proposed. The different effects induced by them are evidenced by experimental results acquired with a given setup and theoretical simulations carried out for more general cases. We distinguish the errors linked to some imperfection of elements in the experimental setup from those linked to the sample under study.

© 2009 Optical Society of America

OCIS Codes
(230.5440) Optical devices : Polarization-selective devices
(260.5430) Physical optics : Polarization

ToC Category:
Physical Optics

Original Manuscript: October 15, 2008
Revised Manuscript: January 23, 2009
Manuscript Accepted: January 23, 2009
Published: February 17, 2009

Matthieu Dubreuil, Sylvain Rivet, Bernard Le Jeune, and Jack Cariou, "Systematic errors specific to a snapshot Mueller matrix polarimeter," Appl. Opt. 48, 1135-1142 (2009)

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