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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 48, Iss. 9 — Mar. 20, 2009
  • pp: 1642–1650

Optical force model based on sequential ray tracing

Eric Aspnes, Tom D. Milster, and Koen Visscher  »View Author Affiliations


Applied Optics, Vol. 48, Issue 9, pp. 1642-1650 (2009)
http://dx.doi.org/10.1364/AO.48.001642


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Abstract

We discuss how information available from ray-tracing techniques can be used to calculate optical forces and torques on particles. A general ray-trace computer code is augmented with the polarization and irradiance distributions of the illumination and Fresnel surface coefficients to give a reasonably accurate prediction of interaction with large particles out of the focal plane. Calculations of trapping location versus nonuniform illumination conditions are compared with an experiment. Other example calculations include trapping a hemispherical lens and a two-particle trap.

© 2009 Optical Society of America

OCIS Codes
(020.7010) Atomic and molecular physics : Laser trapping
(080.2720) Geometric optics : Mathematical methods (general)

ToC Category:
Trapping

History
Original Manuscript: August 21, 2008
Manuscript Accepted: October 25, 2008
Published: March 11, 2009

Citation
Eric Aspnes, Tom D. Milster, and Koen Visscher, "Optical force model based on sequential ray tracing," Appl. Opt. 48, 1642-1650 (2009)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-9-1642

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