Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope
Applied Optics, Vol. 49, Issue 1, pp. 50-55 (2010)
http://dx.doi.org/10.1364/AO.49.000050
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Abstract
We present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions.
© 2010 Optical Society of America
OCIS Codes
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(210.0210) Optical data storage : Optical data storage
(210.4590) Optical data storage : Optical disks
(230.1950) Optical devices : Diffraction gratings
ToC Category:
Optical Data Storage
History
Original Manuscript: August 20, 2009
Revised Manuscript: November 21, 2009
Manuscript Accepted: November 27, 2009
Published: December 23, 2009
Citation
J. Mauricio Flores, Moisés Cywiak, and Fernando Mendoza, "Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope," Appl. Opt. 49, 50-55 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-1-50
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