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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 1 — Jan. 1, 2010
  • pp: 50–55

Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope

J. Mauricio Flores, Moisés Cywiak, and Fernando Mendoza  »View Author Affiliations


Applied Optics, Vol. 49, Issue 1, pp. 50-55 (2010)
http://dx.doi.org/10.1364/AO.49.000050


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Abstract

We present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions.

© 2010 Optical Society of America

OCIS Codes
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(210.0210) Optical data storage : Optical data storage
(210.4590) Optical data storage : Optical disks
(230.1950) Optical devices : Diffraction gratings

ToC Category:
Optical Data Storage

History
Original Manuscript: August 20, 2009
Revised Manuscript: November 21, 2009
Manuscript Accepted: November 27, 2009
Published: December 23, 2009

Citation
J. Mauricio Flores, Moisés Cywiak, and Fernando Mendoza, "Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope," Appl. Opt. 49, 50-55 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-1-50


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References

  1. T. Wilson and C. J. R. Sheppard, Theory and Practice of Scanning Optical Microscopy (Academic, 1983).
  2. C. Sheppard, “The spatial frequency cut-off in three-dimensional imaging,” Optik (Jena) 72, 131-133 (1986).
  3. D. K. Hamilton and T. Wilson, “Surface profile measurement using the confocal microscope,” J. Appl. Phys. 53, 5320-5322(1982). [CrossRef]
  4. D. K. Hamilton and T. Wilson, “Three-dimensional surface measurement using the confocal scanning microscope,” Appl. Phys. B 27, 211-213 (1982). [CrossRef]
  5. I. J. Cox, C. J. R. Sheppard, and T. Wilson, “Improvement in resolution by nearly confocal microscopy,” Appl. Opt. 21, 778-781 (1982). [CrossRef] [PubMed]
  6. J. F. Aguilar, M. Lera, and C. J. R. Sheppard, “Imaging of spheres and surface profiling by confocal microscopy,” Appl. Opt. 39, 4621-4628 (2000). [CrossRef]
  7. M. Kempe and W. Rudolph, “Scanning microscopy through thick layers based on linear correlation,” Opt. Lett. 19, 1919-1921 (1994). [CrossRef] [PubMed]
  8. M. Kempe, “Analysis of heterodyne and confocal microscopy for illumination with broad-bandwidth light,” J. Mod. Opt. 43, 2189-2204 (1996). [CrossRef]
  9. T. Kakuta, S. Shinji, T. Ishida, T. Ozawa, and H. Doushita, “Optical information recording medium,” U.S. Patent 20030031954A1 (2003).
  10. L. Kenneth, “Coated thermoplastic film substrate,” U.S. patent 6,855,415 (15 February 2005).
  11. J. M. Flores, M. Cywiak, M. Servín, and L. P. Juárez P., “Heterodyne two beam Gaussian microscope interferometer,” Opt. Express 15, 8346-8359 (2007). [CrossRef] [PubMed]
  12. M. Cywiak, J. F. Aguilar, and B. Barrientos, “Low-numerical-aperture Gaussian beam confocal system for profiling optically smooth surfaces,” Opt. Eng. 44, 13604(2005). [CrossRef]

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