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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 1 — Jan. 1, 2010
  • pp: 50–55

Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope

J. Mauricio Flores, Moisés Cywiak, and Fernando Mendoza  »View Author Affiliations

Applied Optics, Vol. 49, Issue 1, pp. 50-55 (2010)

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We present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions.

© 2010 Optical Society of America

OCIS Codes
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(210.0210) Optical data storage : Optical data storage
(210.4590) Optical data storage : Optical disks
(230.1950) Optical devices : Diffraction gratings

ToC Category:
Optical Data Storage

Original Manuscript: August 20, 2009
Revised Manuscript: November 21, 2009
Manuscript Accepted: November 27, 2009
Published: December 23, 2009

J. Mauricio Flores, Moisés Cywiak, and Fernando Mendoza, "Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope," Appl. Opt. 49, 50-55 (2010)

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