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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 10 — Apr. 1, 2010
  • pp: 1845–1848

Tip-enhanced Raman spectroscopy with silver-coated optical fiber probe in reflection mode for investigating multiwall carbon nanotubes

Rui Wang, Jia Wang, Fenghuan Hao, Mingqian Zhang, and Qian Tian  »View Author Affiliations

Applied Optics, Vol. 49, Issue 10, pp. 1845-1848 (2010)

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We developed a tip-enhanced Raman spectrometer (TERS) with reflection mode. The instrument, with a scanning shear-force microscope (ShFM) and a side-illumination Raman spectroscope, can overcome the diffraction limit and has high sensitivity. A chemical method to fabricate optical fiber probes with Ag coating is proposed. The local electromagnetic responses of the silver-coated optical fiber probe are numerically analyzed by the finite-difference time-domain method, and the excitation wavelength is optimized to resonate with the localized surface plasmons (LSP) of the probe tip. The instrument is applied to investigate a single multiwall carbon nanotube. The experiment results indicate that our TERS instrument has a spatial resolution better than 70 nm , and the enhancement factor is about 5 × 10 3 .

© 2010 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6450) Spectroscopy : Spectroscopy, Raman
(180.4243) Microscopy : Near-field microscopy

ToC Category:

Original Manuscript: December 22, 2009
Revised Manuscript: March 1, 2010
Manuscript Accepted: March 5, 2010
Published: March 25, 2010

Rui Wang, Jia Wang, Fenghuan Hao, Mingqian Zhang, and Qian Tian, "Tip-enhanced Raman spectroscopy with silver-coated optical fiber probe in reflection mode for investigating multiwall carbon nanotubes," Appl. Opt. 49, 1845-1848 (2010)

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