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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 13 — May. 1, 2010
  • pp: C67–C69

Ultrafast thin-film laser-induced breakdown spectroscopy of doped oxides

Travis Owens, Samuel S. Mao, Erin K. Canfield, Costas P. Grigoropoulos, Xianglei Mao, and Richard E. Russo  »View Author Affiliations


Applied Optics, Vol. 49, Issue 13, pp. C67-C69 (2010)
http://dx.doi.org/10.1364/AO.49.000C67


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Abstract

Single-shot femtosecond laser induced breakdown spectroscopy (LIBS) has been shown to be an effective means of detecting heavy metal dopants in porous thin films. Traditional LIBS analysis of trace dopants in modern painted surfaces or Ti O 2 films is difficult due to the broad noisy spectra of the titanium constituent and interference due to the substrate material. Femtosecond laser pulses provide excellent ablation of the target material with little damage to the underlying substrate. In this study a Ti:sapphire femtosecond laser pulse operated at 800 and 266 nm wavelengths and an Nd : YAG nanosecond laser operated at 266 nm were used to ablate 0.15 15 μm films of Ti O 2 doped with varying amounts of MgO. This application shows excellent detection of Mg down to 60 ppm with little interference by the substrate material.

© 2010 Optical Society of America

OCIS Codes
(140.3440) Lasers and laser optics : Laser-induced breakdown
(140.7090) Lasers and laser optics : Ultrafast lasers
(310.0310) Thin films : Thin films
(300.6365) Spectroscopy : Spectroscopy, laser induced breakdown

History
Original Manuscript: October 2, 2009
Manuscript Accepted: January 15, 2010
Published: February 26, 2010

Citation
Travis Owens, Samuel S. Mao, Erin K. Canfield, Costas P. Grigoropoulos, Xianglei Mao, and Richard E. Russo, "Ultrafast thin-film laser-induced breakdown spectroscopy of doped oxides," Appl. Opt. 49, C67-C69 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-13-C67

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