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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 14 — May. 10, 2010
  • pp: 2644–2652

Experimental determination of the Stokes parameters using a dual photoelastic modulator system

Wei Guan, Paul J. Cook, Grenville A. Jones, and Tiehan H. Shen  »View Author Affiliations

Applied Optics, Vol. 49, Issue 14, pp. 2644-2652 (2010)

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We develop a more general methodology for a dual photoelastic modulator (PEM) system that is used for the determination of the Stokes parameters of an arbitrary light beam. This allows for a degree of arbitrariness in the setting of the retardation amplitudes of both PEMs, thus permitting a robust and effective optimization of the detection system. Various experimental issues are considered and a calibration procedure is described that ensures accurate measurement of the absolute values of the Stokes parameters. Measurements of the Faraday rotation of a CoPt multilayer film are provided as a demonstration of the sensitivity of the dual-PEM system.

© 2010 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(230.3810) Optical devices : Magneto-optic systems

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 22, 2009
Revised Manuscript: April 8, 2010
Manuscript Accepted: April 15, 2010
Published: May 4, 2010

Wei Guan, Paul J. Cook, Grenville A. Jones, and Tiehan H. Shen, "Experimental determination of the Stokes parameters using a dual photoelastic modulator system," Appl. Opt. 49, 2644-2652 (2010)

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