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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 18 — Jun. 20, 2010
  • pp: 3622–3629

High-speed pattern projection for three-dimensional shape measurement using laser speckles

Martin Schaffer, Marcus Grosse, and Richard Kowarschik  »View Author Affiliations

Applied Optics, Vol. 49, Issue 18, pp. 3622-3629 (2010)

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We propose a high-speed projection system that is able to project statistical speckle patterns at a rate of 500 Hz . Its purpose is to generate structured light for a real-time photogrammetry stereo vision setup. As conventional digital light projector (DLP) projection setups are limited in their maximum projection rate to 250 Hz for gray-value patterns, stripe projection systems are usually applied for real-time three-dimensional (3D) measurements. However, these techniques can only be used on steady surfaces as phase unwrapping has to be done. In contrast, the proposed setup is able to measure the shape of multiple spatially separated objects at once. We compare the speckle setup with a system using a DLP projector and with other fast 3D shape measurement setups, like the widely used stripe projection methods, qualitatively and quantitatively.

© 2010 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(150.2950) Machine vision : Illumination

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: March 19, 2010
Revised Manuscript: April 28, 2010
Manuscript Accepted: May 6, 2010
Published: June 18, 2010

Martin Schaffer, Marcus Grosse, and Richard Kowarschik, "High-speed pattern projection for three-dimensional shape measurement using laser speckles," Appl. Opt. 49, 3622-3629 (2010)

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