Characteristics of a scanning nano-slit image sensor for line-and-space patterns
Applied Optics, Vol. 49, Issue 19, pp. 3821-3830 (2010)
http://dx.doi.org/10.1364/AO.49.003821
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Abstract
A single scanning nano-slit is used to study aerial image characteristics. Finite-difference time-domain simulations reveal that, in the far field of such a slit, the detected image contrast is very high over a large spatial frequency range regardless of the polarization direction. In the near field, the TM polarization shows a decrease in contrast at larger spatial frequencies. Experiments verify this characteristic using a
© 2010 Optical Society of America
OCIS Codes
(110.1220) Imaging systems : Apertures
(110.2960) Imaging systems : Image analysis
(260.3910) Physical optics : Metal optics
(260.5430) Physical optics : Polarization
(310.6628) Thin films : Subwavelength structures, nanostructures
ToC Category:
Imaging Systems
History
Original Manuscript: January 19, 2010
Revised Manuscript: June 3, 2010
Manuscript Accepted: June 9, 2010
Published: June 30, 2010
Citation
Anoop George and Tom D. Milster, "Characteristics of a scanning nano-slit image sensor for line-and-space patterns," Appl. Opt. 49, 3821-3830 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-19-3821
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