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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 20 — Jul. 10, 2010
  • pp: 3905–3908

White-light total internal reflection microscopy for characterizing the optical properties of Ag-coated optical fiber tips

Rui Wang, Jia Wang, Fenghuan Hao, and Qian Tian  »View Author Affiliations

Applied Optics, Vol. 49, Issue 20, pp. 3905-3908 (2010)

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The optical properties of the metallized tips used in tip-enhanced Raman spectroscopy (TERS) are vital to resonance enhancement. A white-light scattering-spectrum measuring setup based on total internal reflection microscopy is developed to characterize the optical responses of the metallized tips. The scattering spectra of the Ag-coated optical fiber tips are measured as a demonstration of the methodology and the performance of the setup. A prominent resonance band of 500 550 nm is observed experimentally, which can be interpreted as the result of the excitation of the localized surface plasmon resonance at the Ag-coated optical fiber tip. The optical responses of the Ag-coated optical fiber tips are simulated by a three- dimensional finite-difference time-domain method and the results are compared with the experiments. This method has great application potential in the selection and design of high-performance metallized tips for TERS and other apertureless near-field optical microscopy.

© 2010 Optical Society of America

OCIS Codes
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(260.6970) Physical optics : Total internal reflection
(180.4243) Microscopy : Near-field microscopy

ToC Category:

Original Manuscript: March 30, 2010
Revised Manuscript: June 13, 2010
Manuscript Accepted: June 17, 2010
Published: July 6, 2010

Virtual Issues
Vol. 5, Iss. 11 Virtual Journal for Biomedical Optics

Rui Wang, Jia Wang, Fenghuan Hao, and Qian Tian, "White-light total internal reflection microscopy for characterizing the optical properties of Ag-coated optical fiber tips," Appl. Opt. 49, 3905-3908 (2010)

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