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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 20 — Jul. 10, 2010
  • pp: 3922–3925

Comparison of Mg-based multilayers for solar He II radiation at 30.4 nm wavelength

Jingtao Zhu, Sika Zhou, Haochuan Li, Qiushi Huang, Zhanshan Wang, Karine Le Guen, Min-Hui Hu, Jean-Michel André, and Philippe Jonnard  »View Author Affiliations


Applied Optics, Vol. 49, Issue 20, pp. 3922-3925 (2010)
http://dx.doi.org/10.1364/AO.49.003922


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Abstract

Mg-based multilayers, including SiC/Mg, Co/Mg, B4C/Mg, and Si/Mg, are investigated for solar imaging and a He II calibration lamp at a 30.4 nm wavelength. These multilayers were fabricated by a magnetron sputtering method and characterized by x-ray reflection. The reflectivities of these multilayers were measured by synchrotron radiation. Near-normal-incidence reflectivities of Co/Mg and SiC/Mg multilayer mirrors are as high as 40.3% and 44.6%, respectively, while those of B4C/Mg and Si/Mg mirrors are too low for application. The measured results suggest that SiC/Mg, Co/Mg multilayers are promising for a 30.4 nm wavelength.

© 2010 Optical Society of America

OCIS Codes
(040.7480) Detectors : X-rays, soft x-rays, extreme ultraviolet (EUV)
(230.4170) Optical devices : Multilayers
(310.1620) Thin films : Interference coatings
(340.6720) X-ray optics : Synchrotron radiation
(350.6090) Other areas of optics : Space optics

ToC Category:
Thin Films

History
Original Manuscript: March 16, 2010
Revised Manuscript: June 14, 2010
Manuscript Accepted: June 17, 2010
Published: July 6, 2010

Citation
Jingtao Zhu, Sika Zhou, Haochuan Li, Qiushi Huang, Zhanshan Wang, Karine Le Guen, Min-Hui Hu, Jean-Michel André, and Philippe Jonnard, "Comparison of Mg-based multilayers for solar He II radiation at 30.4 nm wavelength," Appl. Opt. 49, 3922-3925 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-20-3922

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