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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 20 — Jul. 10, 2010
  • pp: 4004–4009

Measurement of three-dimensional deformations using digital holography with radial sensitivity

Christian Kohler, Matias R. Viotti, and G. Armando Albertazzi, Jr.  »View Author Affiliations


Applied Optics, Vol. 49, Issue 20, pp. 4004-4009 (2010)
http://dx.doi.org/10.1364/AO.49.004004


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Abstract

A measurement system based on digital holography for the simultaneous measurement of out-of-plane and radial in-plane displacement fields for the assessment of residual stress is presented. Two holograms are recorded at the same time with a single image taken by a digital camera, allowing the separate evaluation of in-plane and out-of-plane movement. An axis-symmetrical diffractive optical element is used for the illumination of the object, which causes radial sensitivity vectors. By the addition and, respectively, the subtraction, of the four phase maps calculated from two camera frames, the in-plane and out-of-plane deformation of an object can be calculated separately. The device presented is suitable for high-speed, high-resolution measurement of residual stress. In addition to the setup, first measurement results and a short comparison to a mature digital speckle pattern interferometry setup are shown.

© 2010 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(120.2880) Instrumentation, measurement, and metrology : Holographic interferometry
(120.6165) Instrumentation, measurement, and metrology : Speckle interferometry, metrology

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 20, 2010
Revised Manuscript: June 15, 2010
Manuscript Accepted: June 17, 2010
Published: July 9, 2010

Citation
Christian Kohler, Matias R. Viotti, and G. Armando Albertazzi, Jr., "Measurement of three-dimensional deformations using digital holography with radial sensitivity," Appl. Opt. 49, 4004-4009 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-20-4004


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