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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 22 — Aug. 1, 2010
  • pp: 4296–4303

Ultrastable assembly and integration technology for ground- and space-based optical systems

Simon Ressel, Martin Gohlke, Dominik Rauen, Thilo Schuldt, Wolfgang Kronast, Ulrich Mescheder, Ulrich Johann, Dennis Weise, and Claus Braxmaier  »View Author Affiliations


Applied Optics, Vol. 49, Issue 22, pp. 4296-4303 (2010)
http://dx.doi.org/10.1364/AO.49.004296


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Abstract

Optical metrology systems crucially rely on the dimensional stability of the optical path between their individual optical components. We present in this paper a novel adhesive bonding technology for setup of quasi-monolithic systems and compare selected characteristics to the well-established state-of-the-art technique of hydroxide-catalysis bonding. It is demonstrated that within the measurement resolution of our ultraprecise custom heterodyne interferometer, both techniques achieve an equivalent passive path length and tilt stability for time scales between 0.1 mHz and 1 Hz. Furthermore, the robustness of the adhesive bonds against mechanical and thermal inputs has been tested, making this new bonding technique in particular a potential option for interferometric applications in future space missions. The integration process itself is eased by long time scales for alignment, as well as short curing times.

© 2010 Optical Society of America

OCIS Codes
(220.4830) Optical design and fabrication : Systems design
(220.4880) Optical design and fabrication : Optomechanics

ToC Category:
Optical Design and Fabrication

History
Original Manuscript: February 23, 2010
Revised Manuscript: June 19, 2010
Manuscript Accepted: June 20, 2010
Published: July 29, 2010

Citation
Simon Ressel, Martin Gohlke, Dominik Rauen, Thilo Schuldt, Wolfgang Kronast, Ulrich Mescheder, Ulrich Johann, Dennis Weise, and Claus Braxmaier, "Ultrastable assembly and integration technology for ground- and space-based optical systems," Appl. Opt. 49, 4296-4303 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-22-4296

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