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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 24 — Aug. 20, 2010
  • pp: 4483–4488

Crosstalk quantification, analysis, and trends in CMOS image sensors

Lior Blockstein and Orly Yadid-Pecht  »View Author Affiliations


Applied Optics, Vol. 49, Issue 24, pp. 4483-4488 (2010)
http://dx.doi.org/10.1364/AO.49.004483


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Abstract

Pixel crosstalk (CTK) consists of three components, optical CTK (OCTK), electrical CTK (ECTK), and spectral CTK (SCTK). The CTK has been classified into two groups: pixel-architecture dependent and pixel-architecture independent. The pixel-architecture-dependent CTK (PADC) consists of the sum of two CTK components, i.e., the OCTK and the ECTK. This work presents a short summary of a large variety of methods for PADC reduction. Following that, this work suggests a clear quantifiable definition of PADC. Three complementary metal-oxide-semiconductor (CMOS) image sensors based on different technologies were empirically measured, using a unique scanning technology, the S-cube. The PADC is analyzed, and technology trends are shown.

© 2010 Optical Society of America

OCIS Codes
(040.0040) Detectors : Detectors
(100.0100) Image processing : Image processing

ToC Category:
Detectors

History
Original Manuscript: March 15, 2010
Revised Manuscript: July 9, 2010
Manuscript Accepted: July 16, 2010
Published: August 11, 2010

Citation
Lior Blockstein and Orly Yadid-Pecht, "Crosstalk quantification, analysis, and trends in CMOS image sensors," Appl. Opt. 49, 4483-4488 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-24-4483

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