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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 27 — Sep. 20, 2010
  • pp: 5067–5075

Electronic speckle pattern interferometry and digital holographic interferometry with microbolometer arrays at 10.6 μm

Jean-François Vandenrijt and Marc P. Georges  »View Author Affiliations


Applied Optics, Vol. 49, Issue 27, pp. 5067-5075 (2010)
http://dx.doi.org/10.1364/AO.49.005067


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Abstract

Electronic speckle pattern interferometry and digital holographic interferometry are investigated at long infrared wavelengths. Using such wavelengths allows one to extend the measurement range and decrease the sensitivity of the techniques to external perturbations. We discuss the behavior of reflection by the object surfaces due to the long wavelength. We have developed different experimental configurations associating a CO 2 laser emitting at 10.6 μ m and microbolometer arrays. Phase-shifting in-plane and out-of-plane electronic speckle pattern interferometry and lensless digital holographic interferometry are demonstrated on rotation measurements of a solid object.

© 2010 Optical Society of America

OCIS Codes
(120.2880) Instrumentation, measurement, and metrology : Holographic interferometry
(120.6165) Instrumentation, measurement, and metrology : Speckle interferometry, metrology
(040.6808) Detectors : Thermal (uncooled) IR detectors, arrays and imaging

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 2, 2010
Manuscript Accepted: August 3, 2010
Published: September 13, 2010

Citation
Jean-François Vandenrijt and Marc P. Georges, "Electronic speckle pattern interferometry and digital holographic interferometry with microbolometer arrays at 10.6 μm," Appl. Opt. 49, 5067-5075 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-27-5067

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