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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 27 — Sep. 20, 2010
  • pp: 5095–5102

Continuous-wave terahertz interferometry with multiwavelength phase unwrapping

Xinke Wang, Lei Hou, and Yan Zhang  »View Author Affiliations


Applied Optics, Vol. 49, Issue 27, pp. 5095-5102 (2010)
http://dx.doi.org/10.1364/AO.49.005095


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Abstract

Continuous-wave (cw) terahertz (THz) phase imaging can accurately and noninvasively present the depth information of an object’s surface and interior. However, a 2 π ambiguity limits the measurement of a sample with a thickness larger than the detection wavelength of THz waves. A multiwavelength phase unwrapping method is introduced to the cw THz phase imaging to reconstruct the exact phase map of the object. By using this method, three different types of high-density polyethylene samples were measured, and their phase profiles were well extracted. The result shows that this method is effective in cw THz phase imaging and has the potential to improve the applications of cw THz imaging.

© 2010 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(110.6795) Imaging systems : Terahertz imaging

ToC Category:
Imaging Systems

History
Original Manuscript: June 7, 2010
Manuscript Accepted: July 24, 2010
Published: September 14, 2010

Citation
Xinke Wang, Lei Hou, and Yan Zhang, "Continuous-wave terahertz interferometry with multiwavelength phase unwrapping," Appl. Opt. 49, 5095-5102 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-27-5095

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