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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 27 — Sep. 20, 2010
  • pp: 5110–5116

Optical section imaging of the tilted planes by illumination-angle-scanning digital interference holography

Yunseong Jeon and Chung Ki Hong  »View Author Affiliations


Applied Optics, Vol. 49, Issue 27, pp. 5110-5116 (2010)
http://dx.doi.org/10.1364/AO.49.005110


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Abstract

A new method of optical imaging that can generate the section images of arbitrarily tilted planes has been developed from illumination-angle-scanning digital interference holography. A set of complex object fields are reconstructed from the holograms captured as the illumination angle is varied with uniform intervals. After the complex fields are modified with phase ramps that match the tilt (relative to the hologram plane) of a desired observation plane, the image of the object sliced along the tilted plane is obtained from their superposition. The axial resolution of a system employing this method is measured with a step height standard, and it is applied to the tomographic inspection of a microelectromechanical system.

© 2010 Optical Society of America

OCIS Codes
(100.3010) Image processing : Image reconstruction techniques
(110.6880) Imaging systems : Three-dimensional image acquisition
(090.1995) Holography : Digital holography

ToC Category:
Image Processing

History
Original Manuscript: January 28, 2010
Revised Manuscript: May 28, 2010
Manuscript Accepted: August 6, 2010
Published: September 15, 2010

Citation
Yunseong Jeon and Chung Ki Hong, "Optical section imaging of the tilted planes by illumination-angle-scanning digital interference holography," Appl. Opt. 49, 5110-5116 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-27-5110


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