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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 27 — Sep. 20, 2010
  • pp: 5175–5182

General method of sensitivity control for manufacturing errors

Akira Yabe  »View Author Affiliations


Applied Optics, Vol. 49, Issue 27, pp. 5175-5182 (2010)
http://dx.doi.org/10.1364/AO.49.005175


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Abstract

In this paper, the sensitivity control for manufacturing errors is treated from three aspects. A wavefront-based sensitivity function is proposed, the effect of which is verified with the modulation transfer function (MTF)-based Monte Carlo simulation. Then, the direct optimization of the MTF-based Monte Carlo simulation result is proposed. Finally, the effect of the sensitivity control function to get better lens types is shown.

© 2010 Optical Society of America

OCIS Codes
(220.3620) Optical design and fabrication : Lens system design
(080.1753) Geometric optics : Computation methods

ToC Category:
Optical Design and Fabrication

History
Original Manuscript: July 6, 2010
Revised Manuscript: August 22, 2010
Manuscript Accepted: August 22, 2010
Published: September 17, 2010

Citation
Akira Yabe, "General method of sensitivity control for manufacturing errors," Appl. Opt. 49, 5175-5182 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-27-5175

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