In this paper, the sensitivity control for manufacturing errors is treated from three aspects. A wavefront-based sensitivity function is proposed, the effect of which is verified with the modulation transfer function (MTF)-based Monte Carlo simulation. Then, the direct optimization of the MTF-based Monte Carlo simulation result is proposed. Finally, the effect of the sensitivity control function to get better lens types is shown.
© 2010 Optical Society of America
Optical Design and Fabrication
Original Manuscript: July 6, 2010
Revised Manuscript: August 22, 2010
Manuscript Accepted: August 22, 2010
Published: September 17, 2010
Akira Yabe, "General method of sensitivity control for manufacturing errors," Appl. Opt. 49, 5175-5182 (2010)