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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 29 — Oct. 10, 2010
  • pp: 5528–5536

Simultaneous line center and linewidth measurement using dual frequency modulation spectroscopy

Jonathon I. Gillen and David H. McIntyre  »View Author Affiliations


Applied Optics, Vol. 49, Issue 29, pp. 5528-5536 (2010)
http://dx.doi.org/10.1364/AO.49.005528


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Abstract

We propose a method to simultaneously measure the center frequency of a spectral feature and the frequency linewidth of the feature. The method relies on dual frequency modulation of a carrier frequency, which probes the spectral feature, and phase sensitive detection of the transmitted signal at the two modulation frequencies. The detected signals provide two servo-stabilization signals for frequency control of the carrier frequency to the resonance line center and one of the modulation frequencies to the resonance linewidth.

© 2010 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6310) Spectroscopy : Spectroscopy, heterodyne
(300.6380) Spectroscopy : Spectroscopy, modulation

ToC Category:
Spectroscopy

History
Original Manuscript: June 14, 2010
Manuscript Accepted: September 3, 2010
Published: October 5, 2010

Citation
Jonathon I. Gillen and David H. McIntyre, "Simultaneous line center and linewidth measurement using dual frequency modulation spectroscopy," Appl. Opt. 49, 5528-5536 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-29-5528

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