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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 29 — Oct. 10, 2010
  • pp: 5645–5653

Accurate measurement of interferometer group delay using field-compensated scanning white light interferometer

Xiaoke Wan, Ji Wang, and Jian Ge  »View Author Affiliations


Applied Optics, Vol. 49, Issue 29, pp. 5645-5653 (2010)
http://dx.doi.org/10.1364/AO.49.005645


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Abstract

Interferometers are key elements in radial velocity (RV) experiments in astronomy observations, and accurate calibration of the group delay of an interferometer is required for high precision measurements. A novel field-compensated white light scanning Michelson interferometer is introduced as an interfero meter calibration tool. The optical path difference (OPD) scanning was achieved by translating a compensation prism, such that even if the light source were in low spatial coherence, the interference stays spatially phase coherent over a large interferometer scanning range. In the wavelength region of 500 560 nm , a multimode fiber-coupled LED was used as the light source, and high optical efficiency was essential in elevating the signal-to-noise ratio of the interferogram signal. The achromatic OPD scanning required a one-time calibration, and two methods using dual-laser wavelength references and an iodine absorption spectrum reference were employed and cross-verified. In an experiment measuring the group delay of a fixed Michelson interferometer, Fourier analysis was employed to process the interferogram data. The group delay was determined at an accuracy of 1 × 10 5 , and the phase angle precision was typically 2.5 × 10 6 over the wide wavelength region.

© 2010 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.2030) Physical optics : Dispersion
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 17, 2010
Manuscript Accepted: August 16, 2010
Published: October 7, 2010

Citation
Xiaoke Wan, Ji Wang, and Jian Ge, "Accurate measurement of interferometer group delay using field-compensated scanning white light interferometer," Appl. Opt. 49, 5645-5653 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-29-5645


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