OSA's Digital Library

Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 29 — Oct. 10, 2010
  • pp: 5645–5653

Accurate measurement of interferometer group delay using field-compensated scanning white light interferometer

Xiaoke Wan, Ji Wang, and Jian Ge  »View Author Affiliations

Applied Optics, Vol. 49, Issue 29, pp. 5645-5653 (2010)

View Full Text Article

Enhanced HTML    Acrobat PDF (846 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



Interferometers are key elements in radial velocity (RV) experiments in astronomy observations, and accurate calibration of the group delay of an interferometer is required for high precision measurements. A novel field-compensated white light scanning Michelson interferometer is introduced as an interfero meter calibration tool. The optical path difference (OPD) scanning was achieved by translating a compensation prism, such that even if the light source were in low spatial coherence, the interference stays spatially phase coherent over a large interferometer scanning range. In the wavelength region of 500 560 nm , a multimode fiber-coupled LED was used as the light source, and high optical efficiency was essential in elevating the signal-to-noise ratio of the interferogram signal. The achromatic OPD scanning required a one-time calibration, and two methods using dual-laser wavelength references and an iodine absorption spectrum reference were employed and cross-verified. In an experiment measuring the group delay of a fixed Michelson interferometer, Fourier analysis was employed to process the interferogram data. The group delay was determined at an accuracy of 1 × 10 5 , and the phase angle precision was typically 2.5 × 10 6 over the wide wavelength region.

© 2010 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.2030) Physical optics : Dispersion
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 17, 2010
Manuscript Accepted: August 16, 2010
Published: October 7, 2010

Xiaoke Wan, Ji Wang, and Jian Ge, "Accurate measurement of interferometer group delay using field-compensated scanning white light interferometer," Appl. Opt. 49, 5645-5653 (2010)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. J. Ge, D. J. Erskine, and M. Rushford, “An externally dispersed interferometer for sensitive Doppler extrasolar planet searches,” Publ. Astron. Soc. Pac. 114, 1016–1028 (2002). [CrossRef]
  2. J. Ge, “Fixed delay interferometry for Doppler extrasolar planet detection,” Astrophys. J. 571, L165–L168 (2002). [CrossRef]
  3. J. Ge, J. Van Eyken, S. Mahadevan, C. DeWitt, S. R. Kane, R. Cohen, A. Vanden Heuvel, S. W. Fleming, P. Guo, G. W. Henry, D. P. Schneider, L. W. Ramsey, R. A. Wittenmyer, M. Endl, W. D. Cochran, E. B. Ford, E. L. Martin, G. Israelian, J. Valenti, and D. Montes, “The first extrasolar planet discovered with a new generation high throughput Doppler instrument,” Astrophys. J. 648, 683–695 (2006). [CrossRef]
  4. T. Fuji, M. Arakawa, T. Hattori, and H. Nakatsuka, “A white-light Michelson interferometer in the visible and near infrared regions,” Rev. Sci. Instrum. 69, 2854–2858 (1998). [CrossRef]
  5. E. Ribak, C. Roddier, F. Roddier, and J. B. Breckinridge, “Signal-to-noise limitations in white light holography,” Appl. Opt. 27, 1183–1186 (1988). [CrossRef] [PubMed]
  6. D. A. Flavin, R. McBride, and J. D.C. Jones, “Interferometric fiber-optic sensing based on the modulation of group delay and first order dispersion: Application to strain-temperature measurand,” J. Lightwave Technol. 13, 1314–1323 (1995). [CrossRef]
  7. P. de Groot, X. C. de Lega, J. Kramer, and M. Turzhitsky, “Determination of fringe order in white-light interference microscopy,” Appl. Opt. 41, 4571–4578 (2002). [CrossRef] [PubMed]
  8. D. F. Murphy and D. A. Flavin, “Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry,” Appl. Opt. 39, 4607–4615 (2000). [CrossRef]
  9. S. Ridgway, “A Fourier transform spectrophotometer for astronomical applications, 700–10000cm−1,” Rev. Sci. Instrum. 45, 676–679 (1974). [CrossRef]
  10. D. Baker, A. Steed, and A. T. Stair Jr., “Development of infrared interferometry for upper atmospheric emission studies,” Appl. Opt. 20, 1734–1746 (1981). [CrossRef] [PubMed]
  11. Z. J. Lu, W. A. Gault, and R. A. Koehler, “A new scanning method for field-compensated Michelson Interferometers,” J. Phys. E. 21, 68–71 (1988). [CrossRef]
  12. S. Mahadevan, J. Ge, S. W. Fleming, X. Wan, C. Dewitt, J. C. Van Eyken, and D. McDavitt, “An inexpensive field-widened monolithic Michelson interferometer for precision radial velocity measurements,” Publ. Astron. Soc. Pac. 120, 1001–1015(2008). [CrossRef]
  13. K. B. Rochford and S. D. Dyer, “Demultiplexing of interferometrically interrogated fiber Bragg grating sensors using Hilbert transform processing,” J. Lightwave Technol. 17, 831–836(1999). [CrossRef]
  14. X. Wan, J. Wang, and J. Ge, “Resolving fringe ambiguities of a wide-field Michelson interferometer using visibility measurements of a noncollimated laser beam,” Appl. Opt. 48, 4909–4916 (2009). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited