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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 3 — Jan. 20, 2010
  • pp: 329–333

Temperature field analysis of TiO 2 films with high-absorptance inclusions

Shu-hong Li, Hong-bo He, Da-wei Li, Ming Zhou, Xiu-lan Ling, Yuan-an Zhao, and Zheng-xiu Fan  »View Author Affiliations

Applied Optics, Vol. 49, Issue 3, pp. 329-333 (2010)

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To deduce the location of absorptive inclusions in thin films, temperature distributions in pure TiO 2 films and TiO 2 films with high-absorptance inclusions are analyzed based on temperature field theory. According to our theoretic simulations, the surface temperature rise increases when absorptive inclusions are incorporated into thin films and shows different values for different inclusions. With the increase of inclusion thickness, the surface temperature rise varies and has a maximum value. A potential method is presented to deduce the location of absorptive inclusion through calculating the surface temperature rise at two modulated frequencies, if it is possible to know in advance the inclusion material or to prejudge this from a thin-film deposition process.

© 2010 Optical Society of America

OCIS Codes
(140.6810) Lasers and laser optics : Thermal effects
(310.6870) Thin films : Thin films, other properties

ToC Category:
Thin Films

Original Manuscript: November 5, 2009
Revised Manuscript: December 9, 2009
Manuscript Accepted: December 11, 2009
Published: January 12, 2010

Shu-hong Li, Hong-bo He, Da-wei Li, Ming Zhou, Xiu-lan Ling, Yuan-an Zhao, and Zheng-xiu Fan, "Temperature field analysis of TiO2 films with high-absorptance inclusions," Appl. Opt. 49, 329-333 (2010)

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