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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 30 — Oct. 20, 2010
  • pp: 5899–5905

Coherent incident field information through thick random scattering media from speckle correlations over source position

Zhenyu Wang, Kevin J. Webb, and Andrew M. Weiner  »View Author Affiliations


Applied Optics, Vol. 49, Issue 30, pp. 5899-5905 (2010)
http://dx.doi.org/10.1364/AO.49.005899


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Abstract

With two nonoverlapping beams incident at different angles on a heavily scattering medium, the spatial correlation of speckle patterns over source position has a beat that is related to the incident angle difference. A model presented explains the measurement. The spatial correlation is shown to decorrelate faster than the beam intensity correlation function and to be sensitive to the incident field profile. Increased scatter results in more rapid decorrelation. This work suggests new opportunities for imaging through scattering media.

© 2010 Optical Society of America

OCIS Codes
(030.6140) Coherence and statistical optics : Speckle
(030.6600) Coherence and statistical optics : Statistical optics
(110.6150) Imaging systems : Speckle imaging
(290.7050) Scattering : Turbid media

ToC Category:
Coherence and Statistical Optics

History
Original Manuscript: March 2, 2010
Manuscript Accepted: August 20, 2010
Published: October 18, 2010

Virtual Issues
Vol. 6, Iss. 1 Virtual Journal for Biomedical Optics

Citation
Zhenyu Wang, Kevin J. Webb, and Andrew M. Weiner, "Coherent incident field information through thick random scattering media from speckle correlations over source position," Appl. Opt. 49, 5899-5905 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-30-5899

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