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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 32 — Nov. 10, 2010
  • pp: 6364–6375

Statistical properties of finite-bandwidth radiation scattered by random amplitude screens and random phase screens

Kevin D. Ridley and Eric Jakeman  »View Author Affiliations


Applied Optics, Vol. 49, Issue 32, pp. 6364-6375 (2010)
http://dx.doi.org/10.1364/AO.49.006364


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Abstract

We investigate the effect of finite bandwidth of the incident radiation on scattering by thin layers that introduce random phase or amplitude variations. In particular, we calculate the scintillation index of the propagating radiation for smoothly varying and fractal phase screens and for random telegraph wave and checkerboard amplitude screens. Increasing the bandwidth of the incident radiation reduces the fluctuations of the scattered intensity over the whole propagation path, except in the case of the smoothly varying phase screen, where geometrical optics features in the pattern persist in the focusing region.

© 2010 Optical Society of America

OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(030.6140) Coherence and statistical optics : Speckle
(030.6600) Coherence and statistical optics : Statistical optics
(290.5930) Scattering : Scintillation
(110.1758) Imaging systems : Computational imaging

ToC Category:
Coherence and Statistical Optics

History
Original Manuscript: April 28, 2010
Manuscript Accepted: June 15, 2010
Published: November 9, 2010

Citation
Kevin D. Ridley and Eric Jakeman, "Statistical properties of finite-bandwidth radiation scattered by random amplitude screens and random phase screens," Appl. Opt. 49, 6364-6375 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-32-6364

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