OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 34 — Dec. 1, 2010
  • pp: 6570–6576

Proximity projection grating structured light illumination microscopy

Chung W. See, Chin-Jung Chuang, Shugang Liu, and Michael G. Somekh  »View Author Affiliations


Applied Optics, Vol. 49, Issue 34, pp. 6570-6576 (2010)
http://dx.doi.org/10.1364/AO.49.006570


View Full Text Article

Enhanced HTML    Acrobat PDF (725 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Structured illumination has been employed in fluorescence microscopy to extend its lateral resolution. It has been demonstrated that a factor of 2 improvement can be achieved. In this paper, we introduce a novel optical arrangement that can further improve the resolution. It makes use of a fine grating held in close proximity to the sample. The fringe pattern thus projected onto the sample contains grating vectors substantially higher than those that are possible with the conventional structured illumination setup. We will present experimental results to demonstrate the principle of the technique, and will show that, theoretically, it can achieve an imaging NA approaching 4.

© 2010 Optical Society of America

OCIS Codes
(110.4850) Imaging systems : Optical transfer functions
(180.2520) Microscopy : Fluorescence microscopy
(350.5730) Other areas of optics : Resolution
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Microscopy

History
Original Manuscript: May 21, 2010
Revised Manuscript: July 30, 2010
Manuscript Accepted: August 11, 2010
Published: November 24, 2010

Citation
Chung W. See, Chin-Jung Chuang, Shugang Liu, and Michael G. Somekh, "Proximity projection grating structured light illumination microscopy," Appl. Opt. 49, 6570-6576 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-34-6570


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. R. Heintzmann and C. Cremer, “Laterally modulated excitation microscopy: Improvement of resolution by using a diffraction grating,” Proc. SPIE 3568, 185–196 (1999). [CrossRef]
  2. M. G. L. Gustafsson, “Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy,” J. Microsc. 198, 82–87 (2000). [CrossRef] [PubMed]
  3. S. W. Hell and Jan Wichmann, “Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy,” Opt. Lett. 19, 780–782(1994). [CrossRef] [PubMed]
  4. S. W. Hell, E. H. K. Stelzer, S. Lindek, and C. Cremer, “Confocal microscopy with an increased detection aperture: type-B 4Pi confocal microscopy,” Opt. Lett. 19, 222–224 (1994). [CrossRef] [PubMed]
  5. M. G. L. Gustafsson, D. A. Agard, and J. W. Sedat, “I5M: 3D widefield light microscopy with better than 100nm axial resolution,” J. Microsc. 195, 10–16 (1999). [CrossRef] [PubMed]
  6. B. Bailey, D. L. Farkas, D. L. Taylor, and F. Lanni, “Enhancement of axial resolution in fluorescence microscopy by standing-wave excitation,” Nature 366, 44–48 (1993). [CrossRef] [PubMed]
  7. M. G. Somekh, K. Hsu, and M. C. Pitter, “Resolution in structured illumination microscopy: a probabilistic approach,” J. Opt. Soc. Am. 25, 1319–1329 (2008). [CrossRef]
  8. S. Liu, C. J. Chuang, C. W. See, G. Zoriniants, W. L. Barnes, and M. G. Somekh, “Double-grating-structured light microscope using plasmonic nanoparticle arrays,” Opt. Lett. 34, 1255–1257 (2009). [CrossRef] [PubMed]
  9. The value of the k-vector is normalized with respect to 2π/λ so that it has a maximum value of 1 in air.
  10. A. Sentenac, K. Belkebir, H. Giovannini, and P. C. Chaumet, “Subdiffraction resolution in total internal reflection fluorescence microscopy with a grating substrate,” Opt. Lett. 33, 255–257 (2008). [CrossRef] [PubMed]
  11. J. W. Goodman, Introduction to Fourier Optics (Roberts & Co., 2004).
  12. F. Gracia, F. Yubero, J. P. Holgado, J. P. Espinos, A. R. Gonzalez-Elipe, and T. Girardeau, “SiO2/TiO2 thin films with variable refractive index prepared by ion beaminduced and plasma enhanced chemical vapour deposition,” Thin Solid Films 500, 19–26 (2006). [CrossRef]
  13. J. K. Consulting, “Thin film design and applications,” http://www.kruschwitz.com/materials.htm.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited