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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 35 — Dec. 10, 2010
  • pp: 6772–6783

Differential spectral responsivity measurement of photovoltaic detectors with a light-emitting-diode-based integrating sphere source

Ghufron Zaid, Seung-Nam Park, Seongchong Park, and Dong-Hoon Lee  »View Author Affiliations


Applied Optics, Vol. 49, Issue 35, pp. 6772-6783 (2010)
http://dx.doi.org/10.1364/AO.49.006772


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Abstract

We present an experimental realization of differential spectral responsivity measurement by using a light-emitting diode (LED)-based integrating sphere source. The spectral irradiance responsivity is measured by a Lambertian-like radiation field with a diameter of 40 mm at the peak wavelengths of the 35 selectable LEDs covering a range from 280 to 1550 nm . The systematic errors and uncertainties due to lock-in detection, spatial irradiance distribution, and reflection from the test detector are experimentally corrected or considered. In addition, we implemented a numerical procedure to correct the error due to the broad spectral bandwidth of the LEDs. The overall uncertainty of the DSR measurement is evaluated to be 2.2% ( k = 2 ) for Si detectors. To demonstrate its application, we present the measurement results of two Si photovoltaic detectors at different bias irradiance levels up to 120 mW / cm 2 .

© 2010 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5630) Instrumentation, measurement, and metrology : Radiometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: September 17, 2010
Revised Manuscript: November 1, 2010
Manuscript Accepted: November 2, 2010
Published: December 9, 2010

Citation
Ghufron Zaid, Seung-Nam Park, Seongchong Park, and Dong-Hoon Lee, "Differential spectral responsivity measurement of photovoltaic detectors with a light-emitting-diode-based integrating sphere source," Appl. Opt. 49, 6772-6783 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-35-6772


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