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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 35 — Dec. 10, 2010
  • pp: 6808–6815

Real-time heterodyne speckle pattern interferometry using the correlation image sensor

Akira Kimachi  »View Author Affiliations


Applied Optics, Vol. 49, Issue 35, pp. 6808-6815 (2010)
http://dx.doi.org/10.1364/AO.49.006808


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Abstract

A real-time method for heterodyne speckle pattern interferometry using the correlation image sensor (CIS) is proposed. The CIS demodulates the interference phase of heterodyned speckle wavefronts pixelwise at an ordinary video frame rate. The proposed method neither suffers loss of spatial resolution nor requires a high frame rate. Interferometers for out-of-plane and in-plane deformation are developed with a 200×200 pixel CIS camera. Experimental results confirm that the proposed method realizes real-time imaging of a rough-surfaced object under deformation. The average standard deviations of demodulated phase-difference images for the out-of-plane and in-plane interferometers are 0.33 and 0.13 rad, respectively.

© 2010 Optical Society of America

OCIS Codes
(040.2840) Detectors : Heterodyne
(100.2550) Image processing : Focal-plane-array image processors
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(100.3175) Image processing : Interferometric imaging
(120.6165) Instrumentation, measurement, and metrology : Speckle interferometry, metrology

ToC Category:
Image Processing

History
Original Manuscript: August 31, 2010
Manuscript Accepted: October 18, 2010
Published: December 9, 2010

Citation
Akira Kimachi, "Real-time heterodyne speckle pattern interferometry using the correlation image sensor," Appl. Opt. 49, 6808-6815 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-35-6808


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References

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