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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 49, Iss. 36 — Dec. 20, 2010
  • pp: 6878–6887

Microscope system for Blu-ray disc samples

Jun Zhang, Seung-Hune Yang, Youngsik Kim, Tom D. Milster, and Jong Rak Park  »View Author Affiliations


Applied Optics, Vol. 49, Issue 36, pp. 6878-6887 (2010)
http://dx.doi.org/10.1364/AO.49.006878


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Abstract

We introduce a microscope system using a solid immersion lens (SIL) to image Blu-ray disc samples without removing the protective cover layer. The aberration caused by the cover layer is minimized with a truncated SIL. A subsurface imaging simulation is achieved by using the rigorous coupled wave theory, partial coherence, vector diffraction, and the Babinet principle. Simulated results are compared with experimental images and atomic force microscopy measurements.

© 2010 Optical Society of America

OCIS Codes
(110.4980) Imaging systems : Partial coherence in imaging
(210.4245) Optical data storage : Near-field optical recording
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Imaging Systems

History
Original Manuscript: July 21, 2010
Revised Manuscript: November 5, 2010
Manuscript Accepted: November 6, 2010
Published: December 15, 2010

Citation
Jun Zhang, Seung-Hune Yang, Youngsik Kim, Tom D. Milster, and Jong Rak Park, "Microscope system for Blu-ray disc samples," Appl. Opt. 49, 6878-6887 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-36-6878

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