OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 49, Iss. 7 — Mar. 1, 2010
  • pp: 1065–1068

Emissivity of microstructured silicon

Patrick G. Maloney, Peter Smith, Vernon King, Curtis Billman, Mark Winkler, and Eric Mazur  »View Author Affiliations


Applied Optics, Vol. 49, Issue 7, pp. 1065-1068 (2010)
http://dx.doi.org/10.1364/AO.49.001065


View Full Text Article

Enhanced HTML    Acrobat PDF (906 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Infrared transmittance and hemispherical-directional reflectance data from 2.5 to 25 μm on microstructured silicon surfaces have been measured, and spectral emissivity has been calculated for this wavelength range. Hemispherical-total emissivity is calculated for the samples and found to be 0.84 before a measurement-induced annealing and 0.65 after the measurement for the sulfur-doped sample. Secondary samples lack a measurement-induced anneal, and reasons for this discrepancy are presented. Emissivity numbers are plotted and compared with a silicon substrate, and Aeroglaze Z306 black paint. Use of microstructured silicon as a blackbody or microbolometer surface is modeled and presented, respectively.

© 2010 Optical Society of America

OCIS Codes
(240.6490) Optics at surfaces : Spectroscopy, surface
(300.6340) Spectroscopy : Spectroscopy, infrared
(300.6470) Spectroscopy : Spectroscopy, semiconductors
(040.6808) Detectors : Thermal (uncooled) IR detectors, arrays and imaging

ToC Category:
Optics at Surfaces

History
Original Manuscript: September 29, 2009
Revised Manuscript: January 11, 2010
Manuscript Accepted: January 22, 2010
Published: February 22, 2010

Citation
Patrick G. Maloney, Peter Smith, Vernon King, Curtis Billman, Mark Winkler, and Eric Mazur, "Emissivity of microstructured silicon," Appl. Opt. 49, 1065-1068 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-7-1065

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited