Effective permittivities with exact second-order accuracy at inclined dielectric interface for the two-dimensional finite-difference time-domain method
Applied Optics, Vol. 49, Issue 7, pp. 1080-1096 (2010)
http://dx.doi.org/10.1364/AO.49.001080
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Abstract
Accuracy degradation at a dielectric interface in simulations using the finite-difference time-domain method can be prevented by assigning suitable effective permittivities at the nodes in the vicinity of the interface. The effective permittivities with exact second-order accuracy at the interface inclined to the Yee-lattice axis are analytically derived for what we believe to be the first time. We discuss two interfaces with different inclined angles between their normal and the Yee-lattice axis in the case of two-dimensional TE polarization. The tangent of the angle is 1 for one interface and
© 2010 Optical Society of America
OCIS Codes
(000.4430) General : Numerical approximation and analysis
(130.3120) Integrated optics : Integrated optics devices
(230.7370) Optical devices : Waveguides
(260.2110) Physical optics : Electromagnetic optics
ToC Category:
Physical Optics
History
Original Manuscript: November 11, 2009
Revised Manuscript: January 20, 2010
Manuscript Accepted: January 20, 2010
Published: February 22, 2010
Citation
Takuo Hirono, Yuzo Yoshikuni, and Takayuki Yamanaka, "Effective permittivities with exact second-order accuracy at inclined dielectric interface for the two-dimensional finite-difference time-domain method," Appl. Opt. 49, 1080-1096 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-7-1080
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References
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