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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 49, Iss. 7 — Mar. 1, 2010
  • pp: 1080–1096

Effective permittivities with exact second-order accuracy at inclined dielectric interface for the two-dimensional finite-difference time-domain method

Takuo Hirono, Yuzo Yoshikuni, and Takayuki Yamanaka  »View Author Affiliations


Applied Optics, Vol. 49, Issue 7, pp. 1080-1096 (2010)
http://dx.doi.org/10.1364/AO.49.001080


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Abstract

Accuracy degradation at a dielectric interface in simulations using the finite-difference time-domain method can be prevented by assigning suitable effective permittivities at the nodes in the vicinity of the interface. The effective permittivities with exact second-order accuracy at the interface inclined to the Yee-lattice axis are analytically derived for what we believe to be the first time. We discuss two interfaces with different inclined angles between their normal and the Yee-lattice axis in the case of two-dimensional TE polarization. The tangent of the angle is 1 for one interface and 1 / 2 for the other. With the derived effective permittivities, reflection and transmission at the interface are simulated with second-order accuracy with respect to cell size. The accuracy is demonstrated by numerical examples.

© 2010 Optical Society of America

OCIS Codes
(000.4430) General : Numerical approximation and analysis
(130.3120) Integrated optics : Integrated optics devices
(230.7370) Optical devices : Waveguides
(260.2110) Physical optics : Electromagnetic optics

ToC Category:
Physical Optics

History
Original Manuscript: November 11, 2009
Revised Manuscript: January 20, 2010
Manuscript Accepted: January 20, 2010
Published: February 22, 2010

Citation
Takuo Hirono, Yuzo Yoshikuni, and Takayuki Yamanaka, "Effective permittivities with exact second-order accuracy at inclined dielectric interface for the two-dimensional finite-difference time-domain method," Appl. Opt. 49, 1080-1096 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-7-1080


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References

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