Accuracy degradation at a dielectric interface in simulations using the finite-difference time-domain method can be prevented by assigning suitable effective permittivities at the nodes in the vicinity of the interface. The effective permittivities with exact second-order accuracy at the interface inclined to the Yee-lattice axis are analytically derived for what we believe to be the first time. We discuss two interfaces with different inclined angles between their normal and the Yee-lattice axis in the case of two-dimensional TE polarization. The tangent of the angle is 1 for one interface and $1/2$ for the other. With the derived effective permittivities, reflection and transmission at the interface are simulated with second-order accuracy with respect to cell size. The accuracy is demonstrated by numerical examples.

© 2010 Optical Society of America

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