Characterization of optical constants for uranium from 10 to 47 nm
Applied Optics, Vol. 49, Issue 9, pp. 1581-1585 (2010)
http://dx.doi.org/10.1364/AO.49.001581
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Abstract
We use a laser high-harmonics-based extreme-ultraviolet (EUV) polarimeter to determine the optical constants of elemental uranium in the wavelength range from 10 to 47 nm. The constants are extracted from the measured ratio of p-polarized to s-polarized reflectance from a thin uranium film deposited in situ. The film thickness is inferred from a spectroscopic ellipsometry measurement of the sample after complete oxidation in room air. Uranium has been used as a high-reflectance material in the EUV. However, difficulties with oxidation prevented its careful characterization previous to this study. We find that measured optical constants for uranium vary significantly from previous estimates.
© 2010 Optical Society of America
OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(160.3900) Materials : Metals
(160.4760) Materials : Optical properties
(310.6860) Thin films : Thin films, optical properties
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)
ToC Category:
Materials
History
Original Manuscript: January 4, 2010
Manuscript Accepted: February 5, 2010
Published: March 11, 2010
Citation
Nicole Brimhall, Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross, "Characterization of optical constants
for uranium from 10 to 47 nm," Appl. Opt. 49, 1581-1585 (2010)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-49-9-1581
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