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Applied Optics

Applied Optics


  • Vol. 5, Iss. 5 — May. 1, 1966
  • pp: 827–829

Scanning Active Interferometer Employing Linear Drive Excitation and Reflectance Monitor

Vern N. Smiley, Adolph L. Lewis, and David K. Forbes  »View Author Affiliations

Applied Optics, Vol. 5, Issue 5, pp. 827-829 (1966)

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A 0.93-m scanning active interferometer is described, and performance characteristics are discussed. An example of output signal both in the transmitted and reflected mode is given for passive and active operation.

© 1966 Optical Society of America

Original Manuscript: December 15, 1965
Published: May 1, 1966

Vern N. Smiley, Adolph L. Lewis, and David K. Forbes, "Scanning Active Interferometer Employing Linear Drive Excitation and Reflectance Monitor," Appl. Opt. 5, 827-829 (1966)

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  1. R. A. Paananen, Proc. Inst. Radio Engrs 50, 2115 (1962).
  2. R. L. Fork, D. R. Herriott, H. Kogelnik, Appl. Opt. 3, 1471 (1964). [CrossRef]
  3. H. Boersch, G. Herziger, H. Weber, Phys. Letters 8, 109 (1964). [CrossRef]
  4. W. R. Bennett, P. J. Kindlmann, Rev. Sci. Instr. 33, 601 (1962). [CrossRef]
  5. V. N. Smiley, D. K. Forbes, A. L. Lewis, Appl. Phys. Letters 7, 1 (1965). [CrossRef]
  6. V. N. Smiley, A. L. Lewis, D. K. Forbes, J. Opt. Soc. Am. 55, 1552 (1965). [CrossRef]

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