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Scattering of singular beams by subwavelength objects |
Applied Optics, Vol. 50, Issue 1, pp. 33-42 (2011)
http://dx.doi.org/10.1364/AO.50.000033
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Abstract
In recent years, there has been a mounting interest in better methods of measuring nanoscale objects, especially in fields such as nanotechnology, biomedicine, cleantech, and microelectronics. Conventional methods have proved insufficient, due to the classical diffraction limit or slow and complicated measuring procedures. The purpose of this paper is to explore the special characteristics of singular beams with respect to the investigation of subwavelength objects. Singular beams are light beams that contain one or more singularities in their physical parameters, such as phase or polarization. We focus on the three-dimensional interaction between electromagnetic waves and subwavelength objects to extract information about the object from the scattered light patterns.
© 2010 Optical Society of America
OCIS Codes
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.5850) Scattering : Scattering, particles
(050.4865) Diffraction and gratings : Optical vortices
(050.6624) Diffraction and gratings : Subwavelength structures
ToC Category:
Scattering
History
Original Manuscript: August 31, 2010
Revised Manuscript: October 27, 2010
Manuscript Accepted: November 3, 2010
Published: December 21, 2010
Virtual Issues
Vol. 6, Iss. 2 Virtual Journal for Biomedical Optics
Citation
Evyatar Hemo, Boris Spektor, and Joseph Shamir, "Scattering of singular beams by subwavelength objects," Appl. Opt. 50, 33-42 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-1-33
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