|
Spectroscopic null ellipsometer using a variable retarder |
Applied Optics, Vol. 50, Issue 1, pp. 50-52 (2011)
http://dx.doi.org/10.1364/AO.50.000050
Enhanced HTML 
Acrobat PDF (246 KB)
Abstract
We describe a polarizer–compensator–sample–analyzer (PCSA) null ellipsometer in which a variable retarder is used as the compensator and either the polarizer or the analyzer is held at a fixed azimuthal angle. Ellipsometric angles ψ and Δ are determined directly from the azimuth of the rotating component and the compensator delay, respectively. A Soleil–Babinet compensator with quartz plates is used as the variable delay element and the delay at any wavelength is calculated from the independently measured delay at
© 2010 Optical Society of America
OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(240.0240) Optics at surfaces : Optics at surfaces
(260.5430) Physical optics : Polarization
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: August 23, 2010
Revised Manuscript: November 11, 2010
Manuscript Accepted: November 16, 2010
Published: December 22, 2010
Citation
Lionel R. Watkins and Sophie S. Shamailov, "Spectroscopic null ellipsometer using a variable retarder," Appl. Opt. 50, 50-52 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-1-50
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Characteristic properties of Mueller matrices (JOSAA)
- Jones-matrix analysis with Pauli matrices: application to ellipsometry (JOSAA)
- Optimization of retardance for a complete Stokes polarimeter (OL)
- Error Analysis of Null Ellipsometry with Depolarization (AO)
- Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of aqueous solutions (AO)
Related Conference Papers
- Polarization State Control of Light by Single-Walled Carbon Nanotubes
- Design and Implementation of a Nulling Microellipsometer
- Condition Number as a Metric for the Effectiveness of Polarimetric Algorithms
- Polarization-Vortex Focal Fields: Edge and Surface Interactions
- Polarization Effect in the Transmission Through a Single Nanoscopic Aperture
« Previous Article | Next Article »
OSA is a member of 