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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 10 — Apr. 1, 2011
  • pp: 1345–1349

Phase detection sensitivity enhancement of surface plasmon resonance sensor in a heterodyne interferometer system

Wen-Kai Kuo and Chih-Hao Chang  »View Author Affiliations

Applied Optics, Vol. 50, Issue 10, pp. 1345-1349 (2011)

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We propose a method of rotating the analyzer in front of the photodetector in a heterodyne interferometer system to implement optical phase shift and detection sensitivity enhancement of surface plasmon resonance (SPR) sensors. When the analyzer is rotated to shift the phase curve to be near the phase jump point, the phase detection sensitivity of the SPR sensor can be greatly enhanced. Theoretical calculations of a prism-coupled SPR device were performed using this method. Experimental result using an electro-optic heterodyne interferometer is reported.

© 2011 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(240.6680) Optics at surfaces : Surface plasmons

ToC Category:
Optics at Surfaces

Original Manuscript: November 8, 2010
Revised Manuscript: January 21, 2011
Manuscript Accepted: January 21, 2011
Published: March 24, 2011

Wen-Kai Kuo and Chih-Hao Chang, "Phase detection sensitivity enhancement of surface plasmon resonance sensor in a heterodyne interferometer system," Appl. Opt. 50, 1345-1349 (2011)

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