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Phase detection sensitivity enhancement of surface plasmon resonance sensor in a heterodyne interferometer system |
Applied Optics, Vol. 50, Issue 10, pp. 1345-1349 (2011)
http://dx.doi.org/10.1364/AO.50.001345
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Abstract
We propose a method of rotating the analyzer in front of the photodetector in a heterodyne interferometer system to implement optical phase shift and detection sensitivity enhancement of surface plasmon resonance (SPR) sensors. When the analyzer is rotated to shift the phase curve to be near the phase jump point, the phase detection sensitivity of the SPR sensor can be greatly enhanced. Theoretical calculations of a prism-coupled SPR device were performed using this method. Experimental result using an electro-optic heterodyne interferometer is reported.
© 2011 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(240.6680) Optics at surfaces : Surface plasmons
ToC Category:
Optics at Surfaces
History
Original Manuscript: November 8, 2010
Revised Manuscript: January 21, 2011
Manuscript Accepted: January 21, 2011
Published: March 24, 2011
Citation
Wen-Kai Kuo and Chih-Hao Chang, "Phase detection sensitivity enhancement of surface plasmon resonance sensor in a heterodyne interferometer system," Appl. Opt. 50, 1345-1349 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-10-1345
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