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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 12 — Apr. 20, 2011
  • pp: 1758–1764

Measurement of nanometric displacements by correlating two speckle interferograms

Lucas P. Tendela, Gustavo E. Galizzi, Alejandro Federico, and Guillermo H. Kaufmann  »View Author Affiliations


Applied Optics, Vol. 50, Issue 12, pp. 1758-1764 (2011)
http://dx.doi.org/10.1364/AO.50.001758


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Abstract

This paper presents a method to measure nanometric displacement fields using digital speckle pattern interferometry, which can be applied when the generated correlation fringes show less than one complete fringe. The method is based on the evaluation of the correlation between the two speckle interferograms generated by both deformation states of the object. The performance of the proposed method is analyzed using computer-simulated speckle interferograms. A comparison with the performance given by a phase-shifting technique is also presented, and the advantages and limitations of the proposed method are discussed. Finally, the performance of the proposed method to process real data is illustrated.

© 2011 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: December 14, 2010
Revised Manuscript: February 15, 2011
Manuscript Accepted: February 24, 2011
Published: April 15, 2011

Citation
Lucas P. Tendela, Gustavo E. Galizzi, Alejandro Federico, and Guillermo H. Kaufmann, "Measurement of nanometric displacements by correlating two speckle interferograms," Appl. Opt. 50, 1758-1764 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-12-1758


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References

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  12. L. P. Tendela, A. Federico, and G. H. Kaufmann, “Evaluation of the piezoelectric behavior produced by a thick-film transducer using digital speckle pattern interferometry,” Opt. Lasers Eng. 49, 281–284 (2011). [CrossRef]
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