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Spectral domain fluorescence coherence phase microscopy |
Applied Optics, Vol. 50, Issue 12, pp. 1798-1804 (2011)
http://dx.doi.org/10.1364/AO.50.001798
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Abstract
Spectral domain phase microscopy (SDPM) has been reported in the literature as a functional extension to low-coherence interferometry, which enables nanoscale measurement of a scatter’s displacement. The signal in SDPM is generated from structural images that lack molecular specificity. This paper investigates the expansion of phase analysis to fluorescence self-interference signals to provide functional information about a sample. Spectral domain fluorescence coherence phase microscopy is demonstrated for nanoscale resolution motion detection of fluorescent particles with a signal-to-noise ratio limited resolution of
© 2011 Optical Society of America
OCIS Codes
(110.0180) Imaging systems : Microscopy
(110.4500) Imaging systems : Optical coherence tomography
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(180.3170) Microscopy : Interference microscopy
(260.2510) Physical optics : Fluorescence
ToC Category:
Microscopy
History
Original Manuscript: January 13, 2011
Manuscript Accepted: February 7, 2011
Published: April 19, 2011
Virtual Issues
Vol. 6, Iss. 5 Virtual Journal for Biomedical Optics
Citation
Andra St. Quintin, Lukas-Karim Merhi, and Marinko V. Sarunic, "Spectral domain fluorescence coherence phase microscopy," Appl. Opt. 50, 1798-1804 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-12-1798
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