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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 15 — May. 20, 2011
  • pp: 2211–2219

Transmittance and optical constants of erbium films in the 3.25 1580 eV spectral range

Juan I. Larruquert, Fabio Frassetto, Sergio García-Cortés, Manuela Vidal-Dasilva, Mónica Fernández-Perea, José A. Aznárez, José A. Méndez, Luca Poletto, A. Marco Malvezzi, Angelo Giglia, and Stefano Nannarone  »View Author Affiliations


Applied Optics, Vol. 50, Issue 15, pp. 2211-2219 (2011)
http://dx.doi.org/10.1364/AO.50.002211


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Abstract

The optical constants of erbium (Er) films were obtained in the 3.25 1580 eV range from transmittance measurements performed at room temperature. Thin films of Er were deposited by evaporation in ultra high vacuum conditions and their transmittance was measured in situ. Substrates consisted of a thin C film supported on a grid. Transmittance measurements were used to obtain the extinction coefficient k of the Er films. The refractive index n of Er was calculated using the Kramers–Krönig analysis. k data were extrapolated both on the high- and low-energy parts of the spectrum by using experimental data and calculated k values available in the literature. Er, similar to other lanthanides, has a low-absorption band below the O 2 , 3 edge onset; the smallest absorption was measured at ~ 22.5 eV . Therefore, Er is a promising material for filters and multilayer coatings in the energy range below the O 2 , 3 edge, in which materials typically have an absorption stronger than at other energies. Good consistency of the data resulted from the application of f and inertial sum rules.

© 2011 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(230.4170) Optical devices : Multilayers
(260.7200) Physical optics : Ultraviolet, extreme
(310.6860) Thin films : Thin films, optical properties
(350.2450) Other areas of optics : Filters, absorption

ToC Category:
Physical Optics

History
Original Manuscript: November 3, 2010
Manuscript Accepted: January 31, 2011
Published: May 16, 2011

Citation
Juan I. Larruquert, Fabio Frassetto, Sergio García-Cortés, Manuela Vidal-Dasilva, Mónica Fernández-Perea, José A. Aznárez, José A. Méndez, Luca Poletto, A. Marco Malvezzi, Angelo Giglia, and Stefano Nannarone, "Transmittance and optical constants of erbium films in the 3.25−1580 eV spectral range," Appl. Opt. 50, 2211-2219 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-15-2211


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