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Application of “parallel” moiré deflectometry and the single beam Z-scan technique in the measurement of the nonlinear refractive index |
Applied Optics, Vol. 50, Issue 16, pp. 2356-2360 (2011)
http://dx.doi.org/10.1364/AO.50.002356
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Abstract
In this paper, the application of “parallel” moiré deflectometry in measuring the nonlinear refractive index of materials is reported. In “parallel” moiré deflectometry the grating vectors are parallel, and the resulting moiré fringes are also parallel to the grating lines. Compared to “rotational” moiré deflectometry and the Z-scan technique, which cannot easily determine the moiré fringe’s angle of rotation and is sensitive to power fluctuations, respectively, “parallel” moiré deflectometry is more reliable, which allows one to measure the radius of curvature of the light beam by measuring the moiré fringe spacing. The nonlinear refractive index of the sample, including the sense of the change, is obtained from the moiré fringe spacing curve. The method is applied for measuring the nonlinear refractive index of ferrofluids.
© 2011 Optical Society of America
OCIS Codes
(110.6760) Imaging systems : Talbot and self-imaging effects
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques
(190.0190) Nonlinear optics : Nonlinear optics
(190.4400) Nonlinear optics : Nonlinear optics, materials
ToC Category:
Nonlinear Optics
History
Original Manuscript: November 18, 2010
Manuscript Accepted: March 28, 2011
Published: May 23, 2011
Citation
Saifollah Rasouli, H. Ghasemi, M. T. Tavassoly, and H. R. Khalesifard, "Application of “parallel” moiré deflectometry and the single beam Z-scan technique in the measurement of the nonlinear refractive index," Appl. Opt. 50, 2356-2360 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-16-2356
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