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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 17 — Jun. 10, 2011
  • pp: 2793–2798

Slightly off-axis interferometry for microscopy with second wavelength assistance

Junhe Han, Peng Gao, Baoli Yao, Yuzong Gu, and Mingju Huang  »View Author Affiliations


Applied Optics, Vol. 50, Issue 17, pp. 2793-2798 (2011)
http://dx.doi.org/10.1364/AO.50.002793


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Abstract

Slightly off-axis interferometry for microscopy has been performed, where the d c term of the interferogram is suppressed by the object wave in another wavelength. One wavelength of the laser beam (red light) is used to generate the slightly off-axis interferogram, while the second wavelength (blue light) is employed to measure the transmittance of the specimen. Both the red light and blue light are recorded simultaneously by a color CCD camera and can be separated without cross talk via the red–green–blue components. The d c term of the slightly off-axis interferogram of red light is suppressed with the object wave of blue light. As a consequence, the requirement on the off-axis angle between the object and reference waves is relaxed as well as the requirement on the resolving power of CCD camera.

© 2011 Optical Society of America

OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.3170) Microscopy : Interference microscopy

ToC Category:
Microscopy

History
Original Manuscript: January 12, 2011
Revised Manuscript: April 8, 2011
Manuscript Accepted: April 14, 2011
Published: June 9, 2011

Virtual Issues
Vol. 6, Iss. 7 Virtual Journal for Biomedical Optics

Citation
Junhe Han, Peng Gao, Baoli Yao, Yuzong Gu, and Mingju Huang, "Slightly off-axis interferometry for microscopy with second wavelength assistance," Appl. Opt. 50, 2793-2798 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-17-2793


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